An iterative image enhancement algorithm and a new evaluation framework

Li Tian*, Sei Ichiro Kamata

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Image enhancement is important for images captured in low contrast and low illumination conditions. In this study, we propose a new iterative algorithm for image enhancement based on analysis on embedded surfaces of images. In our method, scaled surface area and the surface volume are proposed and used to reconstruct the image iteratively for contrast enhancement, and the illumination of the reconstructed image can also be adjusted simultaneously. On the other hand, the most common methods for measuring the quality of enhanced images Mean Square Error (MSE) or Peak Signal-to-Noise-Ratio (PSNR) have been recognized as inadequate measures because they do not evaluate the result in the way that the human vision system does. This paper also presents a new framework for evaluating image enhancement using both objective and subjective measures. This framework can also be used for other image quality evaluations such as denoising evaluation. We compare our enhancement method with some well-known enhancement algorithms, including wavelet and curvelet methods, using the new evaluation framework. The results show that our method gives better performance in most objective and subjective criteria than the conventional methods.

Original languageEnglish
Title of host publication2008 IEEE International Symposium on Industrial Electronics, ISIE 2008
Pages992-997
Number of pages6
DOIs
Publication statusPublished - 2008
Event2008 IEEE International Symposium on Industrial Electronics, ISIE 2008 - Cambridge, United Kingdom
Duration: 2008 Jun 302008 Jul 2

Publication series

NameIEEE International Symposium on Industrial Electronics

Conference

Conference2008 IEEE International Symposium on Industrial Electronics, ISIE 2008
Country/TerritoryUnited Kingdom
CityCambridge
Period08/6/3008/7/2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering

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