An orientation ratio and ferroelectric properties of ultra-thin PTO films

K. Nishida, T. Sugino, M. Osada, M. Kakihana, T. Katoda

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The relationship among crystallographic orientation and quality, flatness of a surface, electrical properties and thickness for lead titanate (PbTiO3: PTO) ultra-thin films is reported. A crystallographic orientation changed from (100) to (001) with an increase in film thickness. However, a (001) plane orientation ratio α saturated to 0.85 and root square mean (RMS) of flatness saturated to 1.4nm when the film thickness was approximately 90nm. A PTO film thinner than approximately 90nm had a larger dielectric constant and that thicker than approximate 90nm showed ferroelectric property.

Original languageEnglish
Pages (from-to)312-317
Number of pages6
JournalApplied Surface Science
Volume216
Issue number1-4 SPEC.
DOIs
Publication statusPublished - 2003 Jun 30
Externally publishedYes

Keywords

  • Ferroelectrics
  • Film orientation
  • P-E property
  • PTO
  • Substrate

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

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  • Cite this

    Nishida, K., Sugino, T., Osada, M., Kakihana, M., & Katoda, T. (2003). An orientation ratio and ferroelectric properties of ultra-thin PTO films. Applied Surface Science, 216(1-4 SPEC.), 312-317. https://doi.org/10.1016/S0169-4332(03)00446-X