Analysis of microstructures for Co/Pd multilayer perpendicular magnetic recording media with carbon underlayer

T. Asahi*, K. Kuramochi, J. Kawaji, T. Onoue, T. Osaka, M. Saigo

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

37 Citations (Scopus)

Abstract

The effect of amorphous carbon underlayer thickness on the microstructure of the Co/Pd multilayer perpendicular magnetic recording media was investigated. From the magnetic force microscopy observation in the AC-demagnetized state of the Co/Pd multilayer media, the magnetic cluster size was observed to effectively decrease with an increase in carbon underlayer thickness, where the higher coercivity and the higher S/N ratio of the Co/Pd multilayer media were obtained with the thicker underlayer. Furthermore, the distribution of [1 1 1] orientation of FCC-Pd became broader, and the grain size decreased with an increase in the carbon underlayer thickness. These effects caused the magnetic exchange decoupling of Co/Pd multilayer media. We suggested that the change of microstructure was directly related to the surface roughness of the amorphous carbon underlayer.

Original languageEnglish
Pages (from-to)87-92
Number of pages6
JournalJournal of Magnetism and Magnetic Materials
Volume235
Issue number1-3
DOIs
Publication statusPublished - 2001 Oct
EventProceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan
Duration: 2000 Oct 232000 Oct 26

Keywords

  • Amorpgous carbon underlayer
  • Multilayers
  • Perpendicular magnetic recording

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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