Analysis of phonons in graphene sheets by means of HREELS measurement and ab initio calculation

H. Yanagisawa, T. Tanaka, Y. Ishida, M. Matsue, E. Rokuta, S. Otani, C. Oshima

Research output: Contribution to journalArticle

81 Citations (Scopus)

Abstract

We have grown epitaxial thin sheets of graphene on BC3/NbB 2(0001) and measured phonon dispersion curves of the graphene sheets by means of high-resolution electron energy-loss spectroscopy (HREELS). The phonon dispersion curves have been calculated on the basis of ab initio calculations. The observed curves were in good agreement with theoretical curves. The quality of crystallinity of the graphene layers was high compared with the bulk graphite crystals. In this paper, we demonstrate that the combination of HREELS measurement and ab initio calculations is extremely effective for investigation of honeycomb-structured materials.

Original languageEnglish
Pages (from-to)133-136
Number of pages4
JournalSurface and Interface Analysis
Volume37
Issue number2
DOIs
Publication statusPublished - 2005 Feb

Fingerprint

Graphite
Electron energy loss spectroscopy
Phonons
Graphene
graphene
phonons
energy dissipation
electron energy
high resolution
curves
spectroscopy
crystallinity
Crystals
graphite
crystals

Keywords

  • Ab initio calculation
  • Graphite
  • HREELS
  • Phonon

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Yanagisawa, H., Tanaka, T., Ishida, Y., Matsue, M., Rokuta, E., Otani, S., & Oshima, C. (2005). Analysis of phonons in graphene sheets by means of HREELS measurement and ab initio calculation. Surface and Interface Analysis, 37(2), 133-136. https://doi.org/10.1002/sia.1948

Analysis of phonons in graphene sheets by means of HREELS measurement and ab initio calculation. / Yanagisawa, H.; Tanaka, T.; Ishida, Y.; Matsue, M.; Rokuta, E.; Otani, S.; Oshima, C.

In: Surface and Interface Analysis, Vol. 37, No. 2, 02.2005, p. 133-136.

Research output: Contribution to journalArticle

Yanagisawa, H, Tanaka, T, Ishida, Y, Matsue, M, Rokuta, E, Otani, S & Oshima, C 2005, 'Analysis of phonons in graphene sheets by means of HREELS measurement and ab initio calculation', Surface and Interface Analysis, vol. 37, no. 2, pp. 133-136. https://doi.org/10.1002/sia.1948
Yanagisawa, H. ; Tanaka, T. ; Ishida, Y. ; Matsue, M. ; Rokuta, E. ; Otani, S. ; Oshima, C. / Analysis of phonons in graphene sheets by means of HREELS measurement and ab initio calculation. In: Surface and Interface Analysis. 2005 ; Vol. 37, No. 2. pp. 133-136.
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