Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range

H. Tansho, Y. Kuroda, Hiroshi Ishikawa, Yuichi Matsushima, Katsuyuki Utaka

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We have proposed the new waveguide-type Kretschmann-structure surface plasmon resonance sensor employing two incident-angled structures which gives slightly different characteristics for high-sensitive and wide-measurable range.

    Original languageEnglish
    Title of host publicationMOC 2015 - Technical Digest of 20th Microoptics Conference
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9784863485433
    DOIs
    Publication statusPublished - 2016 Feb 23
    Event20th Microoptics Conference, MOC 2015 - Fukuoka, Japan
    Duration: 2015 Oct 252015 Oct 28

    Other

    Other20th Microoptics Conference, MOC 2015
    CountryJapan
    CityFukuoka
    Period15/10/2515/10/28

    Fingerprint

    Surface plasmon resonance
    surface plasmon resonance
    Polymers
    Waveguides
    waveguides
    sensors
    Sensors
    polymers

    Keywords

    • Optical waveguides
    • Performance evaluation
    • Plasmons
    • Reflection
    • Refractive index
    • Sensitivity
    • Surface waves

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics
    • Electronic, Optical and Magnetic Materials

    Cite this

    Tansho, H., Kuroda, Y., Ishikawa, H., Matsushima, Y., & Utaka, K. (2016). Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range. In MOC 2015 - Technical Digest of 20th Microoptics Conference [7416525] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MOC.2015.7416525

    Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range. / Tansho, H.; Kuroda, Y.; Ishikawa, Hiroshi; Matsushima, Yuichi; Utaka, Katsuyuki.

    MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2016. 7416525.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Tansho, H, Kuroda, Y, Ishikawa, H, Matsushima, Y & Utaka, K 2016, Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range. in MOC 2015 - Technical Digest of 20th Microoptics Conference., 7416525, Institute of Electrical and Electronics Engineers Inc., 20th Microoptics Conference, MOC 2015, Fukuoka, Japan, 15/10/25. https://doi.org/10.1109/MOC.2015.7416525
    Tansho H, Kuroda Y, Ishikawa H, Matsushima Y, Utaka K. Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range. In MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc. 2016. 7416525 https://doi.org/10.1109/MOC.2015.7416525
    Tansho, H. ; Kuroda, Y. ; Ishikawa, Hiroshi ; Matsushima, Yuichi ; Utaka, Katsuyuki. / Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range. MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2016.
    @inproceedings{c4784ef5ed2e442e999c9151c13d2765,
    title = "Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range",
    abstract = "We have proposed the new waveguide-type Kretschmann-structure surface plasmon resonance sensor employing two incident-angled structures which gives slightly different characteristics for high-sensitive and wide-measurable range.",
    keywords = "Optical waveguides, Performance evaluation, Plasmons, Reflection, Refractive index, Sensitivity, Surface waves",
    author = "H. Tansho and Y. Kuroda and Hiroshi Ishikawa and Yuichi Matsushima and Katsuyuki Utaka",
    year = "2016",
    month = "2",
    day = "23",
    doi = "10.1109/MOC.2015.7416525",
    language = "English",
    booktitle = "MOC 2015 - Technical Digest of 20th Microoptics Conference",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",
    address = "United States",

    }

    TY - GEN

    T1 - Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range

    AU - Tansho, H.

    AU - Kuroda, Y.

    AU - Ishikawa, Hiroshi

    AU - Matsushima, Yuichi

    AU - Utaka, Katsuyuki

    PY - 2016/2/23

    Y1 - 2016/2/23

    N2 - We have proposed the new waveguide-type Kretschmann-structure surface plasmon resonance sensor employing two incident-angled structures which gives slightly different characteristics for high-sensitive and wide-measurable range.

    AB - We have proposed the new waveguide-type Kretschmann-structure surface plasmon resonance sensor employing two incident-angled structures which gives slightly different characteristics for high-sensitive and wide-measurable range.

    KW - Optical waveguides

    KW - Performance evaluation

    KW - Plasmons

    KW - Reflection

    KW - Refractive index

    KW - Sensitivity

    KW - Surface waves

    UR - http://www.scopus.com/inward/record.url?scp=84969504859&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84969504859&partnerID=8YFLogxK

    U2 - 10.1109/MOC.2015.7416525

    DO - 10.1109/MOC.2015.7416525

    M3 - Conference contribution

    AN - SCOPUS:84969504859

    BT - MOC 2015 - Technical Digest of 20th Microoptics Conference

    PB - Institute of Electrical and Electronics Engineers Inc.

    ER -