Abstract
Stochastic Petri Nets have been developed to model and analyze systems involving concurrent activities. However, the firing times of a Stochastic Petri Net model are always exponentially distributed. This paper presents an aggregate approach on how to analyze Stochastic Petri Net model with non-exponential distributions using a generalized Markov Renewal Process. Therefore, the modeling flexibility of Petri Net and the analyzing power of Markov Renewal Process are fully exploited. Moreover, an Abstract Partial Reachability Graph is introduced to simplify the Markov solution. Furthermore, the aggregate approach is applied to evaluate performance of a parallel operation system.
| Original language | English |
|---|---|
| Pages (from-to) | 933-939 |
| Number of pages | 7 |
| Journal | Microelectronics Reliability |
| Volume | 31 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1991 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
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Cite this
Jin, Q., Sugasawa, Y., & Seya, K. (1991). Analysis of Stochastic Petri Net model with non-exponential distributions using a generalized Markov Renewal Process. Microelectronics Reliability, 31(5), 933-939. https://doi.org/10.1016/0026-2714(91)90038-9