Analysis on the thickness and temperature dependent DC breakdown of low density polyethylene

Daomin Min, Shengtao Li, Yoshimichi Ohki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    The dc breakdown strength of low density polyethylene (LDPE) decreases with an increase in thickness and temperature of the sample. The breakdown strength is influenced by the charge transport and electric field distortion, and is also related to the molecular chain displacement and fracture. This paper investigates mutual relations among the charge transport, molecular chain displacement, and thickness dependent dc breakdown of LDPE. A model that combines the dynamics of charge transport and molecular displacement is used to calculate the space charge accumulation, molecular chain displacement, and dc breakdown properties of LDPE with various thicknesses at various constant voltage ramping rates. The model includes processes of charge injection, charge migration via hopping between shallow traps, charge trapping at and detrapping from deep traps, charge recombination, and molecular chain displacement. The simulation results show that the breakdown field as a function of sample thickness satisfies an inverse power law for various voltage ramping rates. This is consistent with experimental results. The model can also explain the result that the breakdown field increases with an increase in voltage ramping rate. It also demonstrates the negative correlation between the breakdown field and temperature, which is also in good agreement with experimental results.

    Original languageEnglish
    Title of host publicationProceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages368-371
    Number of pages4
    Volume2015-October
    ISBN (Print)9781479989034
    DOIs
    Publication statusPublished - 2015 Oct 8
    Event11th IEEE International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 - Sydney, Australia
    Duration: 2015 Jul 192015 Jul 22

    Other

    Other11th IEEE International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015
    CountryAustralia
    CitySydney
    Period15/7/1915/7/22

    Keywords

    • charge transport
    • dc breakdown
    • low density polyethylene
    • molecular chain displacement
    • temperature
    • thickness

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Materials Chemistry
    • Condensed Matter Physics

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  • Cite this

    Min, D., Li, S., & Ohki, Y. (2015). Analysis on the thickness and temperature dependent DC breakdown of low density polyethylene. In Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials (Vol. 2015-October, pp. 368-371). [7295285] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICPADM.2015.7295285