Anderson's impurity-model analysis on CeO1-xFxBiS2

Takuya Sugimoto, Boby Joseph, Eugenio Paris, Antonella Iadecola, Satoshi Demura, Yoshikazu Mizuguchi, Yoshihiko Takano, Takashi Mizokawa, Naurang L. Saini

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We have investigated the impact of F-doing on CeO1-xFxBiS2 in terms of the electronic-structural parameters of Anderson's impurity-model analysis. It was recently reported using Ce L3-edge x-ray absorption spectroscopy (XAS) that CeOBiS2 falls in the Ce valence fluctuation regime and the F-doping drives the system into the Kondo regime. The Ce L3- edge XAS spectra with the various F-doping levels can be reproduced by adjusting the transfer integral in the Anderson's impurity model. The present analysis indicates that the F-doping to the system corresponds to the decrease of the Ce-Bi transfer integral.

Original languageEnglish
Article number012073
JournalJournal of Physics: Conference Series
Volume592
Issue number1
DOIs
Publication statusPublished - 2014
Externally publishedYes

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x ray absorption
impurities
x ray spectroscopy
absorption spectroscopy
adjusting
valence
electronics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Sugimoto, T., Joseph, B., Paris, E., Iadecola, A., Demura, S., Mizuguchi, Y., ... Saini, N. L. (2014). Anderson's impurity-model analysis on CeO1-xFxBiS2. Journal of Physics: Conference Series, 592(1), [012073]. https://doi.org/10.1088/1742-6596/592/1/012073

Anderson's impurity-model analysis on CeO1-xFxBiS2. / Sugimoto, Takuya; Joseph, Boby; Paris, Eugenio; Iadecola, Antonella; Demura, Satoshi; Mizuguchi, Yoshikazu; Takano, Yoshihiko; Mizokawa, Takashi; Saini, Naurang L.

In: Journal of Physics: Conference Series, Vol. 592, No. 1, 012073, 2014.

Research output: Contribution to journalArticle

Sugimoto, T, Joseph, B, Paris, E, Iadecola, A, Demura, S, Mizuguchi, Y, Takano, Y, Mizokawa, T & Saini, NL 2014, 'Anderson's impurity-model analysis on CeO1-xFxBiS2', Journal of Physics: Conference Series, vol. 592, no. 1, 012073. https://doi.org/10.1088/1742-6596/592/1/012073
Sugimoto T, Joseph B, Paris E, Iadecola A, Demura S, Mizuguchi Y et al. Anderson's impurity-model analysis on CeO1-xFxBiS2. Journal of Physics: Conference Series. 2014;592(1). 012073. https://doi.org/10.1088/1742-6596/592/1/012073
Sugimoto, Takuya ; Joseph, Boby ; Paris, Eugenio ; Iadecola, Antonella ; Demura, Satoshi ; Mizuguchi, Yoshikazu ; Takano, Yoshihiko ; Mizokawa, Takashi ; Saini, Naurang L. / Anderson's impurity-model analysis on CeO1-xFxBiS2. In: Journal of Physics: Conference Series. 2014 ; Vol. 592, No. 1.
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