Angstrom-beam electron diffraction of amorphous materials

Akihiko Hirata, Mingwei Chen

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of ~ 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED.

Original languageEnglish
Pages (from-to)52-58
Number of pages7
JournalJournal of Non-Crystalline Solids
Volume383
DOIs
Publication statusPublished - 2014 Jan 1
Externally publishedYes

Fingerprint

amorphous materials
Electron diffraction
electron diffraction
Glass
glass
arts
Metallic glass
metallic glasses
Aberrations
atomic structure
Oxides
aberration
Electron beams
Electron microscopes
electron microscopes
Diffraction
electron beams
Scanning
scanning
oxides

Keywords

  • Electron diffraction
  • Glass
  • Medium-range order
  • Scanning transmission electron microscopy
  • Short-range order

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Angstrom-beam electron diffraction of amorphous materials. / Hirata, Akihiko; Chen, Mingwei.

In: Journal of Non-Crystalline Solids, Vol. 383, 01.01.2014, p. 52-58.

Research output: Contribution to journalArticle

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