TY - JOUR
T1 - Angstrom-beam electron diffraction of amorphous materials
AU - Hirata, Akihiko
AU - Chen, Mingwei
N1 - Funding Information:
This work was sponsored by “World Premier International (WPI) Research Center Initiative for Atoms, Molecules and Materials”, MEXT, Japan ; Grant-in-Aid for Scientific Research (B) ( 24360260 ) and Grant-in-Aid for Exploratory Research ( 24656400 ), JSPS, Japan . We thank Prof. M. Hasegawa of Nagoya University for providing the Zr 66.7 Ni 33.3 metallic glass ribbons.
PY - 2014/1/1
Y1 - 2014/1/1
N2 - We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of ~ 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED.
AB - We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of ~ 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED.
KW - Electron diffraction
KW - Glass
KW - Medium-range order
KW - Scanning transmission electron microscopy
KW - Short-range order
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U2 - 10.1016/j.jnoncrysol.2013.03.010
DO - 10.1016/j.jnoncrysol.2013.03.010
M3 - Article
AN - SCOPUS:84890129791
VL - 383
SP - 52
EP - 58
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
SN - 0022-3093
ER -