Abstract
We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of ~ 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED.
| Original language | English |
|---|---|
| Pages (from-to) | 52-58 |
| Number of pages | 7 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 383 |
| DOIs | |
| Publication status | Published - 2014 Jan 1 |
| Externally published | Yes |
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Keywords
- Electron diffraction
- Glass
- Medium-range order
- Scanning transmission electron microscopy
- Short-range order
ASJC Scopus subject areas
- Condensed Matter Physics
- Ceramics and Composites
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
Cite this
Angstrom-beam electron diffraction of amorphous materials. / Hirata, Akihiko; Chen, Mingwei.
In: Journal of Non-Crystalline Solids, Vol. 383, 01.01.2014, p. 52-58.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Angstrom-beam electron diffraction of amorphous materials
AU - Hirata, Akihiko
AU - Chen, Mingwei
PY - 2014/1/1
Y1 - 2014/1/1
N2 - We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of ~ 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED.
AB - We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of ~ 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED.
KW - Electron diffraction
KW - Glass
KW - Medium-range order
KW - Scanning transmission electron microscopy
KW - Short-range order
UR - http://www.scopus.com/inward/record.url?scp=84890129791&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84890129791&partnerID=8YFLogxK
U2 - 10.1016/j.jnoncrysol.2013.03.010
DO - 10.1016/j.jnoncrysol.2013.03.010
M3 - Article
AN - SCOPUS:84890129791
VL - 383
SP - 52
EP - 58
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
SN - 0022-3093
ER -