Antiferrodistortive structural phase transition in compressively-strained epitaxial SrTiO3 film grown on (La, Sr)(Al, Ta)O3 substrate

T. Yamada*, T. Kiguchi, A. K. Tagantsev, H. Morioka, T. Iijima, H. Ohsumi, S. Kimura, M. Osada, N. Setter, H. Funakubo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)


(001)-epitaxial SrTiO3 films were grown on (La, Sr)(Al, Ta)O3 substrates for investigating the impact of biaxial strain on the antiferrodistortive (AFD) structural phase transition in SrTiO3. The films were fully constrained by the substrates, which resulted in the large in-plane compressive strain of -0.9%. The AFD transition temperature estimated using temperature controlled x-ray diffraction and transmission electron microscope was over 150K higher than the theoretical prediction, but rather supported the experimental results reported on SrTiO3 films on LaAlO3 substrates.

Original languageEnglish
Pages (from-to)57-62
Number of pages6
JournalIntegrated Ferroelectrics
Issue number1
Publication statusPublished - 2010
Externally publishedYes


  • strain
  • strontium titanate
  • Structural phase transition

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics
  • Control and Systems Engineering


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