APPLICATION OF MONTE CARLO CALCULATION TECHNIQUE TO QUANTITATIVE ANALYSES BY AUGER ELECTRON SPECTROSCOPY.

Ryuichi Shimizu; Shingo Ichimura; Mikio Aratama

APPLICATION OF MONTE CARLO CALCULATION TECHNIQUE TO QUANTITATIVE ANALYSES BY AUGER ELECTRON SPECTROSCOPY.

Ryuichi Shimizu^*, Shingo Ichimura, Mikio Aratama

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

1 Citation (Scopus)

Abstract

A basic study is provided of the atomic number effect for quantitative AES analyses by Monte Carlo calculation technique. Since the direct simulation of each individual inelastic scattering process used in the previous papers applies to only a few materials, the authors have attempted to incorporate a semi-empirical stopping power formula proposed by E. R. Krefting and L. Reimer instead of the individual inelastic scattering. The result describes the dependence of Auger electron intensity on primary energy obtained with a commercial SAM, JEOL JAMP III, with considerable accuracy.

Original language	English
Pages	30-34
Number of pages	5
Publication status	Published - 1979 Jan 1
Externally published	Yes
Event	Proc Annu Conf Microbeam Anal Soc 14th - San Antonio, Tex Duration: 1979 Aug 12 → 1979 Aug 17

Other

Other	Proc Annu Conf Microbeam Anal Soc 14th
City	San Antonio, Tex
Period	79/8/12 → 79/8/17

ASJC Scopus subject areas

Engineering(all)

Cite this

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title = "APPLICATION OF MONTE CARLO CALCULATION TECHNIQUE TO QUANTITATIVE ANALYSES BY AUGER ELECTRON SPECTROSCOPY.",

abstract = "A basic study is provided of the atomic number effect for quantitative AES analyses by Monte Carlo calculation technique. Since the direct simulation of each individual inelastic scattering process used in the previous papers applies to only a few materials, the authors have attempted to incorporate a semi-empirical stopping power formula proposed by E. R. Krefting and L. Reimer instead of the individual inelastic scattering. The result describes the dependence of Auger electron intensity on primary energy obtained with a commercial SAM, JEOL JAMP III, with considerable accuracy.",

author = "Ryuichi Shimizu and Shingo Ichimura and Mikio Aratama",

year = "1979",

month = jan,

day = "1",

language = "English",

pages = "30--34",

note = "Proc Annu Conf Microbeam Anal Soc 14th ; Conference date: 12-08-1979 Through 17-08-1979",

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T1 - APPLICATION OF MONTE CARLO CALCULATION TECHNIQUE TO QUANTITATIVE ANALYSES BY AUGER ELECTRON SPECTROSCOPY.

AU - Shimizu, Ryuichi

AU - Ichimura, Shingo

AU - Aratama, Mikio

PY - 1979/1/1

Y1 - 1979/1/1

N2 - A basic study is provided of the atomic number effect for quantitative AES analyses by Monte Carlo calculation technique. Since the direct simulation of each individual inelastic scattering process used in the previous papers applies to only a few materials, the authors have attempted to incorporate a semi-empirical stopping power formula proposed by E. R. Krefting and L. Reimer instead of the individual inelastic scattering. The result describes the dependence of Auger electron intensity on primary energy obtained with a commercial SAM, JEOL JAMP III, with considerable accuracy.

AB - A basic study is provided of the atomic number effect for quantitative AES analyses by Monte Carlo calculation technique. Since the direct simulation of each individual inelastic scattering process used in the previous papers applies to only a few materials, the authors have attempted to incorporate a semi-empirical stopping power formula proposed by E. R. Krefting and L. Reimer instead of the individual inelastic scattering. The result describes the dependence of Auger electron intensity on primary energy obtained with a commercial SAM, JEOL JAMP III, with considerable accuracy.

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UR - http://www.scopus.com/inward/citedby.url?scp=0018702634&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0018702634

SP - 30

EP - 34

T2 - Proc Annu Conf Microbeam Anal Soc 14th

Y2 - 12 August 1979 through 17 August 1979

ER -

APPLICATION OF MONTE CARLO CALCULATION TECHNIQUE TO QUANTITATIVE ANALYSES BY AUGER ELECTRON SPECTROSCOPY.

Abstract

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ASJC Scopus subject areas

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