Applied technique of focused ion beam milling based on microstructure of photonic bandgap fiber

Xuefeng Li, Jinxing Liang, Toshitsugu Ueda

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    In this paper, a precision micromachining technique for photonic bandgap fiber (PBGF) using focused ion beam (FIB) milling was reported. Types of PBGF have the honeycomb structure with a hollow core surrounded by microstructured cladding, and the widths of the thin silica struts are only 10∼100 nm. The shape of fiber section is the most important prerequisite for maintaining good output coupling efficiency and allowing gas diffusion. Therefore, a proper machining method can avoid microstructure collapse and is crucially important for the experimental investigations. The FIB milling process was discussed and realized to improve performance of PBGF gas cell in this study. The absorption spectra of acetylene (C2H2) gas and methane (CH 4) gas have been investigated using the propose measurement system based on PBGF gas cell. The experimental results clearly indicated a high overlap between the propagating light and filled gas inside the PBGF. Therefore, these studies can contribute to highly sensitive gas sensing, higher accurate wavelength references, and other applications.

    Original languageEnglish
    Pages (from-to)465-471
    Number of pages7
    JournalInternational Journal of Advanced Manufacturing Technology
    Volume68
    Issue number1-4
    DOIs
    Publication statusPublished - 2013

    Fingerprint

    Photonic bandgap fibers
    Focused ion beams
    Microstructure
    Gases
    Honeycomb structures
    Diffusion in gases
    Struts
    Micromachining
    Acetylene
    Absorption spectra
    Machining
    Methane
    Silica
    Wavelength
    Fibers

    Keywords

    • Focused ion beam
    • Micromachining
    • Optical gas sensor
    • Photonic bandgap fiber

    ASJC Scopus subject areas

    • Industrial and Manufacturing Engineering
    • Control and Systems Engineering
    • Computer Science Applications
    • Software
    • Mechanical Engineering

    Cite this

    Applied technique of focused ion beam milling based on microstructure of photonic bandgap fiber. / Li, Xuefeng; Liang, Jinxing; Ueda, Toshitsugu.

    In: International Journal of Advanced Manufacturing Technology, Vol. 68, No. 1-4, 2013, p. 465-471.

    Research output: Contribution to journalArticle

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