Abstract
In this paper, we obtain an accurate asymptotic formula of the Bayes optimal codelength in the case that the sources are not always i.i.d. sources by deriving the asymptotic codelength of sufficient statistic codes.
Original language | English |
---|---|
Title of host publication | IEEE International Symposium on Information Theory - Proceedings |
Place of Publication | Piscataway, NJ, United States |
Publisher | IEEE |
Pages | 421 |
Number of pages | 1 |
Publication status | Published - 1997 |
Event | Proceedings of the 1997 IEEE International Symposium on Information Theory - Ulm, Ger Duration: 1997 Jun 29 → 1997 Jul 4 |
Other
Other | Proceedings of the 1997 IEEE International Symposium on Information Theory |
---|---|
City | Ulm, Ger |
Period | 97/6/29 → 97/7/4 |
Fingerprint
ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
Asymptotic property of sufficient statistic codes. / Matsushima, Toshiyasu; Hirasawa, Shigeichi.
IEEE International Symposium on Information Theory - Proceedings. Piscataway, NJ, United States : IEEE, 1997. p. 421.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Asymptotic property of sufficient statistic codes
AU - Matsushima, Toshiyasu
AU - Hirasawa, Shigeichi
PY - 1997
Y1 - 1997
N2 - In this paper, we obtain an accurate asymptotic formula of the Bayes optimal codelength in the case that the sources are not always i.i.d. sources by deriving the asymptotic codelength of sufficient statistic codes.
AB - In this paper, we obtain an accurate asymptotic formula of the Bayes optimal codelength in the case that the sources are not always i.i.d. sources by deriving the asymptotic codelength of sufficient statistic codes.
UR - http://www.scopus.com/inward/record.url?scp=0030717367&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0030717367&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0030717367
SP - 421
BT - IEEE International Symposium on Information Theory - Proceedings
PB - IEEE
CY - Piscataway, NJ, United States
ER -