Atomic-scale disproportionation in amorphous silicon monoxide

Akihiko Hirata, Shinji Kohara, Toshihiro Asada, Masazumi Arao, Chihiro Yogi, Hideto Imai, Yongwen Tan, Takeshi Fujita, Mingwei Chen

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

Solid silicon monoxide is an amorphous material which has been commercialized for many functional applications. However, the amorphous structure of silicon monoxide is a long-standing question because of the uncommon valence state of silicon in the oxide. It has been deduced that amorphous silicon monoxide undergoes an unusual disproportionation by forming silicon- and silicon-dioxide-like regions. Nevertheless, the direct experimental observation is still missing. Here we report the amorphous structure characterized by angstrom-beam electron diffraction, supplemented by synchrotron X-ray scattering and computer simulations. In addition to the theoretically predicted amorphous silicon and silicon-dioxide clusters, suboxide-type tetrahedral coordinates are detected by angstrom-beam electron diffraction at silicon/silicon-dioxide interfaces, which provides compelling experimental evidence on the atomic-scale disproportionation of amorphous silicon monoxide. Eventually we develop a heterostructure model of the disproportionated silicon monoxide which well explains the distinctive structure and properties of the amorphous material.

Original languageEnglish
Article number11591
JournalNature Communications
Volume7
DOIs
Publication statusPublished - 2016 May 13
Externally publishedYes

Fingerprint

Amorphous silicon
amorphous silicon
Silicon
Silicon Dioxide
silicon
Electron diffraction
amorphous materials
silicon dioxide
Electrons
electron diffraction
Synchrotrons
X ray scattering
Computer Simulation
Oxides
Heterojunctions
Observation
X-Rays
silicon monoxide
synchrotrons
computerized simulation

ASJC Scopus subject areas

  • Chemistry(all)
  • Biochemistry, Genetics and Molecular Biology(all)
  • Physics and Astronomy(all)

Cite this

Hirata, A., Kohara, S., Asada, T., Arao, M., Yogi, C., Imai, H., ... Chen, M. (2016). Atomic-scale disproportionation in amorphous silicon monoxide. Nature Communications, 7, [11591]. https://doi.org/10.1038/ncomms11591

Atomic-scale disproportionation in amorphous silicon monoxide. / Hirata, Akihiko; Kohara, Shinji; Asada, Toshihiro; Arao, Masazumi; Yogi, Chihiro; Imai, Hideto; Tan, Yongwen; Fujita, Takeshi; Chen, Mingwei.

In: Nature Communications, Vol. 7, 11591, 13.05.2016.

Research output: Contribution to journalArticle

Hirata, A, Kohara, S, Asada, T, Arao, M, Yogi, C, Imai, H, Tan, Y, Fujita, T & Chen, M 2016, 'Atomic-scale disproportionation in amorphous silicon monoxide', Nature Communications, vol. 7, 11591. https://doi.org/10.1038/ncomms11591
Hirata, Akihiko ; Kohara, Shinji ; Asada, Toshihiro ; Arao, Masazumi ; Yogi, Chihiro ; Imai, Hideto ; Tan, Yongwen ; Fujita, Takeshi ; Chen, Mingwei. / Atomic-scale disproportionation in amorphous silicon monoxide. In: Nature Communications. 2016 ; Vol. 7.
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