Atomic-scale disproportionation in amorphous silicon monoxide

Akihiko Hirata*, Shinji Kohara, Toshihiro Asada, Masazumi Arao, Chihiro Yogi, Hideto Imai, Yongwen Tan, Takeshi Fujita, Mingwei Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

112 Citations (Scopus)


Solid silicon monoxide is an amorphous material which has been commercialized for many functional applications. However, the amorphous structure of silicon monoxide is a long-standing question because of the uncommon valence state of silicon in the oxide. It has been deduced that amorphous silicon monoxide undergoes an unusual disproportionation by forming silicon- and silicon-dioxide-like regions. Nevertheless, the direct experimental observation is still missing. Here we report the amorphous structure characterized by angstrom-beam electron diffraction, supplemented by synchrotron X-ray scattering and computer simulations. In addition to the theoretically predicted amorphous silicon and silicon-dioxide clusters, suboxide-type tetrahedral coordinates are detected by angstrom-beam electron diffraction at silicon/silicon-dioxide interfaces, which provides compelling experimental evidence on the atomic-scale disproportionation of amorphous silicon monoxide. Eventually we develop a heterostructure model of the disproportionated silicon monoxide which well explains the distinctive structure and properties of the amorphous material.

Original languageEnglish
Article number11591
JournalNature communications
Publication statusPublished - 2016 May 13
Externally publishedYes

ASJC Scopus subject areas

  • Chemistry(all)
  • Biochemistry, Genetics and Molecular Biology(all)
  • Physics and Astronomy(all)


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