Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

Takuji Takahashi, Daisuke Fujita, Hirokazu Fukidome, Ken Ichi Fukui, Hiroki Hibino, Masami Kageshima, Tadahiro Komeda, Ken Nakajima, Makoto Nakamura, Tomonobu Nakayama, Hiroshi Nohira, Kaoru Sasakawa, Naruo Sasaki, Koji Sumitomo, Takayuki Uchihashi, Takanobu Watanabe, Yoichi Yamada

Research output: Contribution to journalEditorial

Original languageEnglish
Article numberSI0001
JournalJapanese journal of applied physics
Volume58
Issue numberSI
DOIs
Publication statusPublished - 2019 Jan 1

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Scanning probe microscopy
Nanostructures
microscopy
scanning
probes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Takahashi, T., Fujita, D., Fukidome, H., Fukui, K. I., Hibino, H., Kageshima, M., ... Yamada, Y. (2019). Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy. Japanese journal of applied physics, 58(SI), [SI0001]. https://doi.org/10.7567/1347-4065/ab2864

Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy. / Takahashi, Takuji; Fujita, Daisuke; Fukidome, Hirokazu; Fukui, Ken Ichi; Hibino, Hiroki; Kageshima, Masami; Komeda, Tadahiro; Nakajima, Ken; Nakamura, Makoto; Nakayama, Tomonobu; Nohira, Hiroshi; Sasakawa, Kaoru; Sasaki, Naruo; Sumitomo, Koji; Uchihashi, Takayuki; Watanabe, Takanobu; Yamada, Yoichi.

In: Japanese journal of applied physics, Vol. 58, No. SI, SI0001, 01.01.2019.

Research output: Contribution to journalEditorial

Takahashi, T, Fujita, D, Fukidome, H, Fukui, KI, Hibino, H, Kageshima, M, Komeda, T, Nakajima, K, Nakamura, M, Nakayama, T, Nohira, H, Sasakawa, K, Sasaki, N, Sumitomo, K, Uchihashi, T, Watanabe, T & Yamada, Y 2019, 'Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy', Japanese journal of applied physics, vol. 58, no. SI, SI0001. https://doi.org/10.7567/1347-4065/ab2864
Takahashi, Takuji ; Fujita, Daisuke ; Fukidome, Hirokazu ; Fukui, Ken Ichi ; Hibino, Hiroki ; Kageshima, Masami ; Komeda, Tadahiro ; Nakajima, Ken ; Nakamura, Makoto ; Nakayama, Tomonobu ; Nohira, Hiroshi ; Sasakawa, Kaoru ; Sasaki, Naruo ; Sumitomo, Koji ; Uchihashi, Takayuki ; Watanabe, Takanobu ; Yamada, Yoichi. / Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy. In: Japanese journal of applied physics. 2019 ; Vol. 58, No. SI.
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