Abstract
We propose a Design for Testability System for Mega Gate LSIs. This system meets various demands of designers, because this system has high flexibility. We show the flexibility by introducing some examples of circuit insertion which is supported by the system.
| Original language | English |
|---|---|
| Pages (from-to) | 126-129 |
| Number of pages | 4 |
| Journal | Proceedings of the Asian Test Symposium |
| Publication status | Published - 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1997 6th Asian Test Symposium - Akita, Jpn Duration: 1997 Nov 17 → 1997 Nov 19 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering