Automated Tool for Revising Masking MC/DC Test Suite

Chen Zhenxiang; Hironori Washizaki; Yoshiaki Fukazawa

doi:10.1109/ISSREW51248.2020.00060

Automated Tool for Revising Masking MC/DC Test Suite

Chen Zhenxiang, Hironori Washizaki, Yoshiaki Fukazawa

School of Fundamental Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Modified Condition and Decision Coverage (MC/DC) is a software testing criterion to check code coverage. It can be divided into a unique-cause MC/DC and masking MC/DC, according to the level of acceptance in concepts. Although masking MC/DC is used in many applications, in our study we found undetectable cases utilizing Masking MC/DC test suites that could be detected using stricter unique-cause MC/DC. To ensure the strictness of MC/DC criterion, herein we propose an automated tool that revises the masking MC/DC test suite into a unique-cause MC/DC.

Original language	English
Title of host publication	Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
Editors	Marco Vieira, Henrique Madeira, Nuno Antunes, Zheng Zheng
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	157-158
Number of pages	2
ISBN (Electronic)	9781728198705
DOIs	https://doi.org/10.1109/ISSREW51248.2020.00060
Publication status	Published - 2020 Oct
Event	31st IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2020 - Virtual, Coimbra, Portugal Duration: 2020 Oct 12 → 2020 Oct 15

Publication series

Name	Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020

Conference

Conference	31st IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
Country/Territory	Portugal
City	Virtual, Coimbra
Period	20/10/12 → 20/10/15

Keywords

Modified Condition and Decision Coverage
Soft-ware testing
masking MC/DC

ASJC Scopus subject areas

Software
Safety, Risk, Reliability and Quality

Access to Document

10.1109/ISSREW51248.2020.00060

Cite this

Zhenxiang, C., Washizaki, H., & Fukazawa, Y. (2020). Automated Tool for Revising Masking MC/DC Test Suite. In M. Vieira, H. Madeira, N. Antunes, & Z. Zheng (Eds.), Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020 (pp. 157-158). [9307631] (Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSREW51248.2020.00060

Automated Tool for Revising Masking MC/DC Test Suite. / Zhenxiang, Chen; Washizaki, Hironori ; Fukazawa, Yoshiaki.

Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020. ed. / Marco Vieira; Henrique Madeira; Nuno Antunes; Zheng Zheng. Institute of Electrical and Electronics Engineers Inc., 2020. p. 157-158 9307631 (Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Zhenxiang, C, Washizaki, H & Fukazawa, Y 2020, Automated Tool for Revising Masking MC/DC Test Suite. in M Vieira, H Madeira, N Antunes & Z Zheng (eds), Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020., 9307631, Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020, Institute of Electrical and Electronics Engineers Inc., pp. 157-158, 31st IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2020, Virtual, Coimbra, Portugal, 20/10/12. https://doi.org/10.1109/ISSREW51248.2020.00060

Zhenxiang C, Washizaki H , Fukazawa Y. Automated Tool for Revising Masking MC/DC Test Suite. In Vieira M, Madeira H, Antunes N, Zheng Z, editors, Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020. Institute of Electrical and Electronics Engineers Inc. 2020. p. 157-158. 9307631. (Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020). doi: 10.1109/ISSREW51248.2020.00060

Zhenxiang, Chen ; Washizaki, Hironori ; Fukazawa, Yoshiaki. / Automated Tool for Revising Masking MC/DC Test Suite. Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020. editor / Marco Vieira ; Henrique Madeira ; Nuno Antunes ; Zheng Zheng. Institute of Electrical and Electronics Engineers Inc., 2020. pp. 157-158 (Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020).

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abstract = "Modified Condition and Decision Coverage (MC/DC) is a software testing criterion to check code coverage. It can be divided into a unique-cause MC/DC and masking MC/DC, according to the level of acceptance in concepts. Although masking MC/DC is used in many applications, in our study we found undetectable cases utilizing Masking MC/DC test suites that could be detected using stricter unique-cause MC/DC. To ensure the strictness of MC/DC criterion, herein we propose an automated tool that revises the masking MC/DC test suite into a unique-cause MC/DC.",

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Automated Tool for Revising Masking MC/DC Test Suite

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Keywords

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