Backscattering correction for quantitative Auger analysis. II. Verifications of the backscattering factors through quantification by AES

Shingo Ichimura, R. Shimizu, T. Ikuta

Research output: Contribution to journalArticle

45 Citations (Scopus)

Abstract

The validity and utility of the backscattering correction factors obtained from Monte Carlo calculations for quantitative analysis by Auger electron spectroscopy (AES) were examined through practical quantification of surface concentrations of binary alloys. Quantifications were attempted, first, to access the surface composition of a sputter-deposited NiPt layer, which is probably the most appropriate test-sample with known surface composition for surface analysis. The quantification by AES has led to the result that the surface composition of the layer agrees well with the bulk composition of the sputtered NiPt alloy, as expected. The composition of a sputtered AuCu alloy surface was, then, examined according to the same correction procedure as for the NiPt layer, leading to the confirmation that no preferential sputtering is observed for AuCu alloys by AES as Färber et al. reported.

Original languageEnglish
Pages (from-to)259-269
Number of pages11
JournalSurface Science
Volume115
Issue number2
DOIs
Publication statusPublished - 1982 Mar 1
Externally publishedYes

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Auger electron spectroscopy
Backscattering
Surface structure
Auger spectroscopy
electron spectroscopy
backscattering
Chemical analysis
Binary alloys
Surface analysis
Sputtering
binary alloys
quantitative analysis
sputtering

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Backscattering correction for quantitative Auger analysis. II. Verifications of the backscattering factors through quantification by AES. / Ichimura, Shingo; Shimizu, R.; Ikuta, T.

In: Surface Science, Vol. 115, No. 2, 01.03.1982, p. 259-269.

Research output: Contribution to journalArticle

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