Ballistic field electron emission from demountable single atom tip

E. Rokuta, T. Itagaki, K. Nomura, T. Ishikawa, B. L. Cho, H. S. Kuo, I. W. Hwang, T. T. Tsong, C. Oshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Highly coherent electron emitter is an attractive research subject in nanotechnology. In our group, novel field electron tips of which the entire dimensions are approximately a few nanometers were grown on the apex of the W tip. Owing to thermodynamically stable structures of the nanotips, the equivalent atomic structures were repeatedly reproduced merely by annealing at moderate temperatures. Furthermore, they were found to retrieve the pristine field emission properties. These characteristics, also regarded the "self-reparing function" and "demountable property", respectively, are important for the practical application. In this talk, the structural sample-fabrication procedures, the results of the endurance (destruction-and-regeneration) tests, and the experimental data of the field electron microscopy (FEM), field ion microscopy, and spectroscopy (FES) of the nanotip are shown.. As a result, peculiar emission processes are clarified.

Original languageEnglish
Title of host publicationProceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
Pages781-784
Number of pages4
Volume2
DOIs
Publication statusPublished - 2006
Event22nd International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV - Matsue
Duration: 2006 Sep 252006 Sep 29

Other

Other22nd International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
CityMatsue
Period06/9/2506/9/29

Fingerprint

Nanotips
Electron emission
Ballistics
Atoms
Electrons
Nanotechnology
Field emission
Electron microscopy
Microscopic examination
Durability
Spectroscopy
Annealing
Fabrication
Ions
Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Rokuta, E., Itagaki, T., Nomura, K., Ishikawa, T., Cho, B. L., Kuo, H. S., ... Oshima, C. (2006). Ballistic field electron emission from demountable single atom tip. In Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV (Vol. 2, pp. 781-784). [4195000] https://doi.org/10.1109/DEIV.2006.357419

Ballistic field electron emission from demountable single atom tip. / Rokuta, E.; Itagaki, T.; Nomura, K.; Ishikawa, T.; Cho, B. L.; Kuo, H. S.; Hwang, I. W.; Tsong, T. T.; Oshima, C.

Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 2 2006. p. 781-784 4195000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rokuta, E, Itagaki, T, Nomura, K, Ishikawa, T, Cho, BL, Kuo, HS, Hwang, IW, Tsong, TT & Oshima, C 2006, Ballistic field electron emission from demountable single atom tip. in Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. vol. 2, 4195000, pp. 781-784, 22nd International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV, Matsue, 06/9/25. https://doi.org/10.1109/DEIV.2006.357419
Rokuta E, Itagaki T, Nomura K, Ishikawa T, Cho BL, Kuo HS et al. Ballistic field electron emission from demountable single atom tip. In Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 2. 2006. p. 781-784. 4195000 https://doi.org/10.1109/DEIV.2006.357419
Rokuta, E. ; Itagaki, T. ; Nomura, K. ; Ishikawa, T. ; Cho, B. L. ; Kuo, H. S. ; Hwang, I. W. ; Tsong, T. T. ; Oshima, C. / Ballistic field electron emission from demountable single atom tip. Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 2 2006. pp. 781-784
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