Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2

Hiroki Kusano, Nobuyuki Hasebe, Hiroshi Nagaoka, Takuro Kodama, Yuki Oyama, Reiko Tanaka, Yoshiharu Amano, Kyeong J. Kim, Jose A. Matias Lopes

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    An active X-ray spectrometer (AXS) is now being developed as a payload candidate for the rover on SELENE-2, the next Japanese lunar exploration mission. The AXS will determine the chemical compositions of lunar rocks and regolith around the landing site. The surface of lunar rock samples will be ground using a rock abrasion tool. Thus, fundamental studies on the X-ray fluorescence analysis for lunar rocks and regolith are required to design and develop the AXS. In this study, we have investigated the X-ray fluorescence analysis in order to evaluate the effects of surface roughness of samples and the angle of incident and emergent X-rays. It was found that the fluorescent X-ray yield for low energy X-rays, i.e. the light elements, decreases at rough surface samples. This effect of surface roughness becomes small for smooth surface samples. It was also found that the fluorescent X-ray yield depends on the incident angle, which is attributed to the fact that the X-ray fluorescence occurs closer to the sample surface at larger incident angles. Since the emergent X-rays are affected by the detection geometry and surface roughness, the incident angle effect also depends on the above conditions.

    Original languageEnglish
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
    Volume8852
    DOIs
    Publication statusPublished - 2013
    EventSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV - San Diego, CA
    Duration: 2013 Aug 262013 Aug 28

    Other

    OtherSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV
    CitySan Diego, CA
    Period13/8/2613/8/28

    Fingerprint

    X ray spectrometers
    X ray analysis
    Spectrometer
    spectrometers
    X rays
    lunar rocks
    x rays
    Rocks
    Surface roughness
    Fluorescence
    Surface Roughness
    Angle
    surface roughness
    regolith
    fluorescence
    Lunar missions
    Landing
    lunar exploration
    Abrasion
    landing sites

    Keywords

    • Active X-ray spectrometer
    • Elemental composition
    • Moon
    • SELENE-2
    • X-ray uorescence

    ASJC Scopus subject areas

    • Applied Mathematics
    • Computer Science Applications
    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

    Cite this

    Kusano, H., Hasebe, N., Nagaoka, H., Kodama, T., Oyama, Y., Tanaka, R., ... Matias Lopes, J. A. (2013). Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8852). [88520B] https://doi.org/10.1117/12.2024004

    Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2. / Kusano, Hiroki; Hasebe, Nobuyuki; Nagaoka, Hiroshi; Kodama, Takuro; Oyama, Yuki; Tanaka, Reiko; Amano, Yoshiharu; Kim, Kyeong J.; Matias Lopes, Jose A.

    Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8852 2013. 88520B.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Kusano, H, Hasebe, N, Nagaoka, H, Kodama, T, Oyama, Y, Tanaka, R, Amano, Y, Kim, KJ & Matias Lopes, JA 2013, Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8852, 88520B, SPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV, San Diego, CA, 13/8/26. https://doi.org/10.1117/12.2024004
    Kusano H, Hasebe N, Nagaoka H, Kodama T, Oyama Y, Tanaka R et al. Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8852. 2013. 88520B https://doi.org/10.1117/12.2024004
    Kusano, Hiroki ; Hasebe, Nobuyuki ; Nagaoka, Hiroshi ; Kodama, Takuro ; Oyama, Yuki ; Tanaka, Reiko ; Amano, Yoshiharu ; Kim, Kyeong J. ; Matias Lopes, Jose A. / Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8852 2013.
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    AU - Oyama, Yuki

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