Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2

Hiroki Kusano, Nobuyuki Hasebe, Hiroshi Nagaoka, Takuro Kodama, Yuki Oyama, Reiko Tanaka, Yoshiharu Amano, Kyeong J. Kim, Jose A. Matias Lopes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

An active X-ray spectrometer (AXS) is now being developed as a payload candidate for the rover on SELENE-2, the next Japanese lunar exploration mission. The AXS will determine the chemical compositions of lunar rocks and regolith around the landing site. The surface of lunar rock samples will be ground using a rock abrasion tool. Thus, fundamental studies on the X-ray fluorescence analysis for lunar rocks and regolith are required to design and develop the AXS. In this study, we have investigated the X-ray fluorescence analysis in order to evaluate the effects of surface roughness of samples and the angle of incident and emergent X-rays. It was found that the fluorescent X-ray yield for low energy X-rays, i.e. the light elements, decreases at rough surface samples. This effect of surface roughness becomes small for smooth surface samples. It was also found that the fluorescent X-ray yield depends on the incident angle, which is attributed to the fact that the X-ray fluorescence occurs closer to the sample surface at larger incident angles. Since the emergent X-rays are affected by the detection geometry and surface roughness, the incident angle effect also depends on the above conditions.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XV
DOIs
Publication statusPublished - 2013 Nov 8
EventSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV - San Diego, CA, United States
Duration: 2013 Aug 262013 Aug 28

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8852
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV
CountryUnited States
CitySan Diego, CA
Period13/8/2613/8/28

Keywords

  • Active X-ray spectrometer
  • Elemental composition
  • Moon
  • SELENE-2
  • X-ray uorescence

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kusano, H., Hasebe, N., Nagaoka, H., Kodama, T., Oyama, Y., Tanaka, R., Amano, Y., Kim, K. J., & Matias Lopes, J. A. (2013). Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV [88520B] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8852). https://doi.org/10.1117/12.2024004