Beam diagnostics for high quality electron beam emitted from photocathode rf-gun

Kazuyuki Sakaue; Norio Kudo; Ryo Moriyama; Masakazu Washio

doi:10.1088/1742-6596/31/1/067

Beam diagnostics for high quality electron beam emitted from photocathode rf-gun

Kazuyuki Sakaue^*, Norio Kudo, Ryo Moriyama, Masakazu Washio

^*Corresponding author for this work

School of Advanced Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

High quality electron beam generation using photocathode rf-gun system and beam diagnostic techniques have been developed at Waseda University. This system can generate up to 4.6 MeV low emittance and short bunch electron beam. For bunch length monitor, rf-kicker technique is able to streak the electron bunch directly, using transverse magnetic field on the beam orbit. This technique is able to observe the longitudinal profile of the bunch and to achieve higher resolution than streak camera method.

Original language	English
Pages (from-to)	229-230
Number of pages	2
Journal	Journal of Physics: Conference Series
Volume	31
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/31/1/067
Publication status	Published - 2006 Mar 22

ASJC Scopus subject areas

Physics and Astronomy(all)

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AB - High quality electron beam generation using photocathode rf-gun system and beam diagnostic techniques have been developed at Waseda University. This system can generate up to 4.6 MeV low emittance and short bunch electron beam. For bunch length monitor, rf-kicker technique is able to streak the electron bunch directly, using transverse magnetic field on the beam orbit. This technique is able to observe the longitudinal profile of the bunch and to achieve higher resolution than streak camera method.

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Beam diagnostics for high quality electron beam emitted from photocathode rf-gun

Abstract

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