Beam profile indicator for swift heavy ions using phosphor afterglow

T. Z. Zhan, C. N. Xu, H. Yamada, Y. Terasawa, L. Zhang, H. Iwase, M. Kawai

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl2O4:Eu2+ and CaSrAl2Si 2O8:Eu2+ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-irradiated areas has a Gaussian distribution. Moreover, afterglow intensity and irradiation fluence are linearly related, indicating that this type of indicator has good dose linearity. The results suggest that long-lasting phosphors are promising SHI beam profile indicators with high spatial resolution.

Original languageEnglish
Article number032116
JournalAIP Advances
Volume2
Issue number3
DOIs
Publication statusPublished - 2012
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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