Bit-write-reducing and error-correcting code generation by clustering error-correcting codewords for non-volatile memories

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)

    Abstract

    Non-volatile memories are paid attention to as a promising alternative to memory design. Data stored in them still may be destructed due to crosstalk and radiation. We can restore the data by using error-correcting codes which require extra bits to correct bit errors. Further, non-volatile memories consume ten to hundred times more energy than normal memories in bit-writing. When we configure them using error-correcting codes, it is quite necessary to reduce writing bits. In this paper, we propose a method to generate a bit-write-reducing code with error-correcting ability. We first pick up an error-correcting code which can correct t-bit errors. We cluster its codeswords and generate a cluster graph satisfying the S-bit flip conditions. We assign a data to be written to each cluster. In other words, we generate one-to-many mapping from each data to the codewords in the cluster. We prove that, if the cluster graph is a complete graph, every data in a memory cell can be re-written into another data by flipping at most S bits keeping error-correcting ability to t bits. We further propose an efficient method to cluster error-correcting codewords. Experimental results demonstrate that, when we apply our bit-write-reducing code to MediaBench applications, it can reduce writing-bit counts by up to 28.2% and also energy consumption of non-volatile memory cells by up to 27.9% compared to existing error-correcting codes keeping the same error-correcting ability. This paper proposes the world-first theoretically near-optimal bit-write-reducing code with error-correcting ability based on the efficient coding theories.

    Original languageEnglish
    Title of host publication2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages682-689
    Number of pages8
    ISBN (Print)9781467383882
    DOIs
    Publication statusPublished - 2016 Jan 5
    Event34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015 - Austin, United States
    Duration: 2015 Nov 22015 Nov 6

    Other

    Other34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
    CountryUnited States
    CityAustin
    Period15/11/215/11/6

    ASJC Scopus subject areas

    • Computer Graphics and Computer-Aided Design

    Fingerprint Dive into the research topics of 'Bit-write-reducing and error-correcting code generation by clustering error-correcting codewords for non-volatile memories'. Together they form a unique fingerprint.

    Cite this