Blue-laser scanned imaging system using positioning marks formed on an optical disk substrate

Takayuki Shima, Xiaomin Wang, Hideyuki Shiramizu, Makoto Fujimaki, Koichi Awazu, Yoshimichi Ohki

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    We improved the optical disk-based imaging system to make more precise images at low cost for safety enhancement applications to observe and detect micrometer-order hazardous substances collected on a large-area surface. An optical disk substrate with positioning marks is prepared, and a signal processor is developed to automatically construct an image using the marks. We successfully obtained an image of Escherichia coli dispersed on an optical disk sample surface with a laser-scanning interval of 0.40μm in the optical disk's radial direction; this interval is reduced from the 0.74 and 1.36μm intervals demonstrated in our previous papers.

    Original languageEnglish
    Article number058003
    JournalJapanese Journal of Applied Physics
    Volume56
    Issue number5
    DOIs
    Publication statusPublished - 2017 May 1

    Fingerprint

    optical disks
    Imaging systems
    positioning
    Lasers
    Substrates
    intervals
    Escherichia coli
    lasers
    Scanning
    Escherichia
    central processing units
    Costs
    micrometers
    safety
    scanning
    augmentation

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

    Cite this

    Blue-laser scanned imaging system using positioning marks formed on an optical disk substrate. / Shima, Takayuki; Wang, Xiaomin; Shiramizu, Hideyuki; Fujimaki, Makoto; Awazu, Koichi; Ohki, Yoshimichi.

    In: Japanese Journal of Applied Physics, Vol. 56, No. 5, 058003, 01.05.2017.

    Research output: Contribution to journalArticle

    Shima, Takayuki ; Wang, Xiaomin ; Shiramizu, Hideyuki ; Fujimaki, Makoto ; Awazu, Koichi ; Ohki, Yoshimichi. / Blue-laser scanned imaging system using positioning marks formed on an optical disk substrate. In: Japanese Journal of Applied Physics. 2017 ; Vol. 56, No. 5.
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