Brillouin scattering study of bulk GaN

M. Yamaguchi, T. Yagi, Takayuki Sota, T. Deguchi, K. Shimada, S. Nakamura

    Research output: Contribution to journalArticle

    69 Citations (Scopus)

    Abstract

    High-resolution Brillouin scattering experiments have been performed for a high-quality free-standing gallium nitride (GaN) substrate. Elastic stiffness constants are reported. A comparison is made with the results of an earlier study for a GaN thin film on sapphire substrate.

    Original languageEnglish
    Pages (from-to)8502-8504
    Number of pages3
    JournalJournal of Applied Physics
    Volume85
    Issue number12
    Publication statusPublished - 1999 Jun 15

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    gallium nitrides
    scattering
    stiffness
    sapphire
    high resolution
    thin films

    ASJC Scopus subject areas

    • Physics and Astronomy(all)
    • Physics and Astronomy (miscellaneous)

    Cite this

    Yamaguchi, M., Yagi, T., Sota, T., Deguchi, T., Shimada, K., & Nakamura, S. (1999). Brillouin scattering study of bulk GaN. Journal of Applied Physics, 85(12), 8502-8504.

    Brillouin scattering study of bulk GaN. / Yamaguchi, M.; Yagi, T.; Sota, Takayuki; Deguchi, T.; Shimada, K.; Nakamura, S.

    In: Journal of Applied Physics, Vol. 85, No. 12, 15.06.1999, p. 8502-8504.

    Research output: Contribution to journalArticle

    Yamaguchi, M, Yagi, T, Sota, T, Deguchi, T, Shimada, K & Nakamura, S 1999, 'Brillouin scattering study of bulk GaN', Journal of Applied Physics, vol. 85, no. 12, pp. 8502-8504.
    Yamaguchi M, Yagi T, Sota T, Deguchi T, Shimada K, Nakamura S. Brillouin scattering study of bulk GaN. Journal of Applied Physics. 1999 Jun 15;85(12):8502-8504.
    Yamaguchi, M. ; Yagi, T. ; Sota, Takayuki ; Deguchi, T. ; Shimada, K. ; Nakamura, S. / Brillouin scattering study of bulk GaN. In: Journal of Applied Physics. 1999 ; Vol. 85, No. 12. pp. 8502-8504.
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    AU - Shimada, K.

    AU - Nakamura, S.

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