Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection

Makoto Nishizawa, Kento Hasegawa, Nozomu Togawa

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In IoT (Internet-of-Things) era, the number and variety of hardware devices become continuously increasing. At that time, if an attacker can directly modify a hardware device and insert a malicious circuit into it, we may face severe security risk. The malicious device normally sleeps and is separated from the original hardware device. It can be rarely activated and works as a malicious function. Capacitance measurement is one of the very powerful ways to detect a malicious device. Particularly, measuring capacitance while the hardware device is running is a major challenge but there exists no such researches proposed so far. This paper proposes a capacitance measuring device which measures device capacitance in operation. We firstly combine the AC (alternating current) voltage signal with the DC (direct current) supply voltage signal and generates the offset signal. We supply the offset signal to the target device instead of supplying the DC supply voltage. Then it is theoretically shown that, by effectively filtering the observed current in the target device, the filtered current can be proportional to the capacitance value and thus we can measure the target device capacitance even when it is running. We have implemented the proposed capacitance measuring device on the printed wiring board with the size of 100mm × 81.3mm and applied to the hardware device with a small malicious device. The experiments demonstrate that the proposed capacitance measuring device successfully detects the malicious hardware installed on the original hardware device.

    Original languageEnglish
    Title of host publication2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages362-365
    Number of pages4
    ISBN (Electronic)9781538682401
    DOIs
    Publication statusPublished - 2019 Jan 8
    Event14th IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018 - Chengdu, China
    Duration: 2018 Oct 262018 Oct 30

    Publication series

    Name2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018

    Conference

    Conference14th IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018
    CountryChina
    CityChengdu
    Period18/10/2618/10/30

    Fingerprint

    Capacitance measurement
    hardware
    Capacitance
    capacitance
    Hardware
    Electric potential
    Printed circuit boards
    electric potential
    direct current
    Networks (circuits)
    sleep
    wiring
    supplying
    inserts

    Keywords

    • capacitance measurement
    • hardware security
    • malicious function detection

    ASJC Scopus subject areas

    • Biomedical Engineering
    • Electrical and Electronic Engineering
    • Instrumentation

    Cite this

    Nishizawa, M., Hasegawa, K., & Togawa, N. (2019). Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. In 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018 (pp. 362-365). [8605668] (2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APCCAS.2018.8605668

    Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. / Nishizawa, Makoto; Hasegawa, Kento; Togawa, Nozomu.

    2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018. Institute of Electrical and Electronics Engineers Inc., 2019. p. 362-365 8605668 (2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Nishizawa, M, Hasegawa, K & Togawa, N 2019, Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. in 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018., 8605668, 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Institute of Electrical and Electronics Engineers Inc., pp. 362-365, 14th IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, Chengdu, China, 18/10/26. https://doi.org/10.1109/APCCAS.2018.8605668
    Nishizawa M, Hasegawa K, Togawa N. Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. In 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018. Institute of Electrical and Electronics Engineers Inc. 2019. p. 362-365. 8605668. (2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018). https://doi.org/10.1109/APCCAS.2018.8605668
    Nishizawa, Makoto ; Hasegawa, Kento ; Togawa, Nozomu. / Capacitance Measurement of Running Hardware Devices and its Application to Malicious Modification Detection. 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 362-365 (2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018).
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