Case Study: Project Management Using Cross Project Software Reliability Growth Model Considering System Scale

Kiyoshi Honda, Nobuhiro Nakamura, Hironori Washizaki, Yoshiaki Fukazawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We propose a method to compare software products developed by the same company in the same domain. Our method, which measures the time series of the number of detected faults, employs software reliability growth models (SRGMs). SRGMs describe the relations between faults and the time necessary to detect them. Herein our method is extended to classify past projects for comparison to current projects to help managers and developers decide when to end the test phases or release a project. Past projects are classified by three parameters: lines of code, number of test cases, and test density. Then SRGM is applied. Our extended method is applied to the datasets for nine projects developed by Sumitomo Electric Industries, Ltd. Classification by test density produces the best results.

Original languageEnglish
Title of host publicationProceedings - 2016 IEEE 27th International Symposium on Software Reliability Engineering Workshops, ISSREW 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages41-44
Number of pages4
ISBN (Electronic)9781509036011
DOIs
Publication statusPublished - 2016 Dec 16
Event27th IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2016 - Ottawa, Canada
Duration: 2016 Oct 232016 Oct 27

Other

Other27th IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2016
CountryCanada
CityOttawa
Period16/10/2316/10/27

Keywords

  • Empirical study
  • Faults prediction
  • Software Reliability Growth Model

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Software

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  • Cite this

    Honda, K., Nakamura, N., Washizaki, H., & Fukazawa, Y. (2016). Case Study: Project Management Using Cross Project Software Reliability Growth Model Considering System Scale. In Proceedings - 2016 IEEE 27th International Symposium on Software Reliability Engineering Workshops, ISSREW 2016 (pp. 41-44). [7789374] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSREW.2016.45