Catastrophic Failure and Cumulative Damage Models Involving Two Types of Extended Exponential Distributions

Hiroaki Mohri, Jun Ichi Takeshita*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This study supposes a single unit and investigates cumulative damage and catastrophic failure models for the unit, in situations where the interarrival times between the shocks, and the magnitudes of the shocks, involve two different stochastic processes. In order to consider two essentially different stochastic processes, integer gamma and Weibull distributions are treated as distributions with two parameters and extensions of exponential distributions. With respect to the cumulative damage models, under the assumption that the interarrival times between shocks follow exponential distributions, the case in which the magnitudes of the shocks follow integer gamma distributions is analyzed. With respect to the catastrophic failure models, the respective cases in which the interarrival times between shocks follow integer gamma and Weibull distributions are discussed. Finally, the study provides some characteristic values for reliability in such models.

Original languageEnglish
Article number2141004
JournalInternational Journal of Reliability, Quality and Safety Engineering
Volume29
Issue number4
DOIs
Publication statusPublished - 2022 Aug 1
Externally publishedYes

Keywords

  • Reliability
  • Weibull distributions
  • first passage time to failure
  • integer gamma distributions
  • two types of shocks

ASJC Scopus subject areas

  • Computer Science(all)
  • Nuclear Energy and Engineering
  • Safety, Risk, Reliability and Quality
  • Aerospace Engineering
  • Energy Engineering and Power Technology
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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