Causal transmission line model incorporating frequency-dependent linear resistors

Atsushi Takeshige, Yuji Ito, Kyoya Takano, Kosuke Katayama, Takeshi Yoshida, Minoru Fujishima, Shuhei Amakawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An empirical transmission line (TL) model is proposed that incorporates frequency-dependent linear resistors. The use of such resistors allows experimentally observed characteristics of TLs (frequency dependence of dielectric losses, especially) to be better reproduced compared to models built only of ordinary frequency-independent RLCs. All components of the model, including frequency-dependent resistors, have well-defined time-domain responses and therefore the model is causal. The proposed model fits and reproduces the measured characteristics of TLs fabricated using a 65-nm CMOS process well in the frequency range from 0.5 to 330 GHz.

Original languageEnglish
Title of host publication2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509056163
DOIs
Publication statusPublished - 2017 Jun 7
Externally publishedYes
Event21st IEEE Workshop on Signal and Power Integrity, SPI 2017 - Lake Maggiore (Baveno), Italy
Duration: 2017 May 72017 May 10

Other

Other21st IEEE Workshop on Signal and Power Integrity, SPI 2017
CountryItaly
CityLake Maggiore (Baveno)
Period17/5/717/5/10

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Signal Processing

Cite this

Takeshige, A., Ito, Y., Takano, K., Katayama, K., Yoshida, T., Fujishima, M., & Amakawa, S. (2017). Causal transmission line model incorporating frequency-dependent linear resistors. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings [7944045] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SaPIW.2017.7944045