Causal transmission line model incorporating frequency-dependent linear resistors

Atsushi Takeshige; Yuji Ito; Kyoya Takano; Kosuke Katayama; Takeshi Yoshida; Minoru Fujishima; Shuhei Amakawa

doi:10.1109/SaPIW.2017.7944045

Causal transmission line model incorporating frequency-dependent linear resistors

Atsushi Takeshige, Yuji Ito, Kyoya Takano, Kosuke Katayama, Takeshi Yoshida, Minoru Fujishima, Shuhei Amakawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

An empirical transmission line (TL) model is proposed that incorporates frequency-dependent linear resistors. The use of such resistors allows experimentally observed characteristics of TLs (frequency dependence of dielectric losses, especially) to be better reproduced compared to models built only of ordinary frequency-independent RLCs. All components of the model, including frequency-dependent resistors, have well-defined time-domain responses and therefore the model is causal. The proposed model fits and reproduces the measured characteristics of TLs fabricated using a 65-nm CMOS process well in the frequency range from 0.5 to 330 GHz.

Original language	English
Title of host publication	2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509056163
DOIs	https://doi.org/10.1109/SaPIW.2017.7944045
Publication status	Published - 2017 Jun 7
Externally published	Yes
Event	21st IEEE Workshop on Signal and Power Integrity, SPI 2017 - Lake Maggiore (Baveno), Italy Duration: 2017 May 7 → 2017 May 10

Publication series

Name	2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings

Other

Other	21st IEEE Workshop on Signal and Power Integrity, SPI 2017
Country/Territory	Italy
City	Lake Maggiore (Baveno)
Period	17/5/7 → 17/5/10

ASJC Scopus subject areas

Computer Networks and Communications
Hardware and Architecture
Signal Processing

Access to Document

10.1109/SaPIW.2017.7944045

Cite this

Takeshige, A., Ito, Y., Takano, K., Katayama, K., Yoshida, T., Fujishima, M., & Amakawa, S. (2017). Causal transmission line model incorporating frequency-dependent linear resistors. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings [7944045] (2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SaPIW.2017.7944045

Causal transmission line model incorporating frequency-dependent linear resistors. / Takeshige, Atsushi; Ito, Yuji; Takano, Kyoya; Katayama, Kosuke; Yoshida, Takeshi; Fujishima, Minoru; Amakawa, Shuhei.

2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. 7944045 (2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Takeshige, A, Ito, Y, Takano, K, Katayama, K, Yoshida, T, Fujishima, M & Amakawa, S 2017, Causal transmission line model incorporating frequency-dependent linear resistors. in 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings., 7944045, 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 21st IEEE Workshop on Signal and Power Integrity, SPI 2017, Lake Maggiore (Baveno), Italy, 17/5/7. https://doi.org/10.1109/SaPIW.2017.7944045

Takeshige A, Ito Y, Takano K, Katayama K, Yoshida T, Fujishima M et al. Causal transmission line model incorporating frequency-dependent linear resistors. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. 7944045. (2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings). https://doi.org/10.1109/SaPIW.2017.7944045

Takeshige, Atsushi ; Ito, Yuji ; Takano, Kyoya ; Katayama, Kosuke ; Yoshida, Takeshi ; Fujishima, Minoru ; Amakawa, Shuhei. / Causal transmission line model incorporating frequency-dependent linear resistors. 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. (2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings).

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abstract = "An empirical transmission line (TL) model is proposed that incorporates frequency-dependent linear resistors. The use of such resistors allows experimentally observed characteristics of TLs (frequency dependence of dielectric losses, especially) to be better reproduced compared to models built only of ordinary frequency-independent RLCs. All components of the model, including frequency-dependent resistors, have well-defined time-domain responses and therefore the model is causal. The proposed model fits and reproduces the measured characteristics of TLs fabricated using a 65-nm CMOS process well in the frequency range from 0.5 to 330 GHz.",

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AB - An empirical transmission line (TL) model is proposed that incorporates frequency-dependent linear resistors. The use of such resistors allows experimentally observed characteristics of TLs (frequency dependence of dielectric losses, especially) to be better reproduced compared to models built only of ordinary frequency-independent RLCs. All components of the model, including frequency-dependent resistors, have well-defined time-domain responses and therefore the model is causal. The proposed model fits and reproduces the measured characteristics of TLs fabricated using a 65-nm CMOS process well in the frequency range from 0.5 to 330 GHz.

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Causal transmission line model incorporating frequency-dependent linear resistors

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