Abstract
An empirical transmission line (TL) model is proposed that incorporates frequency-dependent linear resistors. The use of such resistors allows experimentally observed characteristics of TLs (frequency dependence of dielectric losses, especially) to be better reproduced compared to models built only of ordinary frequency-independent RLCs. All components of the model, including frequency-dependent resistors, have well-defined time-domain responses and therefore the model is causal. The proposed model fits and reproduces the measured characteristics of TLs fabricated using a 65-nm CMOS process well in the frequency range from 0.5 to 330 GHz.
| Original language | English |
|---|---|
| Title of host publication | 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781509056163 |
| DOIs | |
| Publication status | Published - 2017 Jun 7 |
| Externally published | Yes |
| Event | 21st IEEE Workshop on Signal and Power Integrity, SPI 2017 - Lake Maggiore (Baveno), Italy Duration: 2017 May 7 → 2017 May 10 |
Other
| Other | 21st IEEE Workshop on Signal and Power Integrity, SPI 2017 |
|---|---|
| Country | Italy |
| City | Lake Maggiore (Baveno) |
| Period | 17/5/7 → 17/5/10 |
ASJC Scopus subject areas
- Computer Networks and Communications
- Hardware and Architecture
- Signal Processing
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Takeshige, A., Ito, Y., Takano, K., Katayama, K., Yoshida, T., Fujishima, M., & Amakawa, S. (2017). Causal transmission line model incorporating frequency-dependent linear resistors. In 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings [7944045] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SaPIW.2017.7944045