CdTe stacked detectors for gamma-ray detection

Shin Watanabe, Tadayuki Takahashi, Yuu Okada, Goro Sato, Manabu Kouda, Takefumi Mitani, Yoshihito Kobayashi, Kazuhiro Nakazawa, Yoshikatsu Kuroda, Mitsunobu Onishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We describe a stacked detector made of thin CdTe diode detectors. By using a thin CdTe device, we can overcome the charge loss problem due to the small mobility and short lifetime of holes in CdTe or CdZnTe detectors. However, a CdTe detector with a thickness of more than 5 mm is needed for adequate detection efficiency for gamma-rays of several hundred keV. Good energy resolution and good peak detection efficiency are difficult to obtain using such a thick CdTe detector. The stacked detector enabled us to realize a detector with both high energy resolution (∼ 1%) and good efficiencies for gamma-rays up to several hundred keV. In this paper, we report the advantage of CdTe thin detectors and the performance of CdTe stacked detectors made of ten layers of a 0.5 mm thick CdTe diode detectors with a surface area of 21.5 mm × 21.5 mm.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
Pages2434-2438
Number of pages5
Volume4
Publication statusPublished - 2002
Event2001 IEEE Nuclear Science Symposium Conference Record - San Diego, CA
Duration: 2001 Nov 42001 Nov 10

Other

Other2001 IEEE Nuclear Science Symposium Conference Record
CitySan Diego, CA
Period01/11/401/11/10

    Fingerprint

Keywords

  • CdTe
  • CdTe diode detector
  • CdZnTe
  • Stacked detector

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Watanabe, S., Takahashi, T., Okada, Y., Sato, G., Kouda, M., Mitani, T., Kobayashi, Y., Nakazawa, K., Kuroda, Y., & Onishi, M. (2002). CdTe stacked detectors for gamma-ray detection. In IEEE Nuclear Science Symposium and Medical Imaging Conference (Vol. 4, pp. 2434-2438)