Characterization of ClOx radicals in vacuum-ultraviolet-irradiated high-purity silica glass

Hiroyuki Nishikawa, Ryuta Nakamura, Yoshimichi Ohki, Kaya Nagasawa, Yoshimasa Hama

    Research output: Contribution to journalArticle

    13 Citations (Scopus)

    Abstract

    An electron-spin-resonance (ESR) study was made on the defect centers induced by vacuum-ultraviolet (vuv) laser (7.9-eV) irradiation in high-purity silica glasses. We observed two types of ESR spectra, each consisting of a concentric pair of four-line peaks, in low-OH oxygen-surplus silica produced with plasma methods. Spin-Hamiltonian parameters determined by computer simulation of the experimental ESR line shapes are consistent with oxy-radicals of chlorine. The observed ClOx (x=2,3) radicals are considered to be due to the reaction between chlorine and oxygen, which were both produced by vuv-laser irradiation.

    Original languageEnglish
    Pages (from-to)8073-8079
    Number of pages7
    JournalPhysical Review B
    Volume46
    Issue number13
    DOIs
    Publication statusPublished - 1992

    Fingerprint

    silica glass
    Fused silica
    Paramagnetic resonance
    Ultraviolet lasers
    electron paramagnetic resonance
    purity
    Chlorine
    Vacuum
    ultraviolet lasers
    vacuum
    chlorine
    Oxygen
    Hamiltonians
    irradiation
    oxygen
    Laser beam effects
    resonance lines
    Silicon Dioxide
    line shape
    computerized simulation

    ASJC Scopus subject areas

    • Condensed Matter Physics

    Cite this

    Characterization of ClOx radicals in vacuum-ultraviolet-irradiated high-purity silica glass. / Nishikawa, Hiroyuki; Nakamura, Ryuta; Ohki, Yoshimichi; Nagasawa, Kaya; Hama, Yoshimasa.

    In: Physical Review B, Vol. 46, No. 13, 1992, p. 8073-8079.

    Research output: Contribution to journalArticle

    Nishikawa, Hiroyuki ; Nakamura, Ryuta ; Ohki, Yoshimichi ; Nagasawa, Kaya ; Hama, Yoshimasa. / Characterization of ClOx radicals in vacuum-ultraviolet-irradiated high-purity silica glass. In: Physical Review B. 1992 ; Vol. 46, No. 13. pp. 8073-8079.
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