Characterization of crystallographic texture in plasma-sprayed splats by electron-backscattered diffraction

Kentaro Shinoda, Masahiko Demura, Hideyuki Murakami, Seiji Kuroda, Sanjay Sampath

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

The surface microtexture of splats deposited by atmospheric dc plasma spraying was studied by the electron-backscattered diffraction method. The examined splats were yttria-stabilized zirconia (YSZ) and nickel deposited onto a mirror-polished stainless steel substrate preheated to 500. K. The YSZ splats exhibited a disk-shaped morphology and had a peculiar < 111> fiber texture in their peripheral region; the fiber axes were perpendicular to the substrate at the periphery but inclined toward the center as their radial positions shifted toward the center. This implies that the microtexture of an YSZ splat cannot be regarded as a single fiber texture even when it exhibits a disk-shaped morphology. It was in contrast to nickel splats, which consisted of a single < 100> fiber texture.

Original languageEnglish
Pages (from-to)3614-3618
Number of pages5
JournalSurface and Coatings Technology
Volume204
Issue number21-22
DOIs
Publication statusPublished - 2010 Aug 1
Externally publishedYes

Fingerprint

Electron diffraction
Yttria stabilized zirconia
textures
electron diffraction
Textures
yttria-stabilized zirconia
Plasmas
fibers
Fibers
Nickel
nickel
plasma spraying
Plasma spraying
Stainless Steel
Substrates
stainless steels
Mirrors
Stainless steel
mirrors

Keywords

  • Crystalline oxides
  • Electron backscattering diffraction (EBSD)
  • Plasma spraying
  • Rapid solidification
  • Single splat
  • Texture

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Characterization of crystallographic texture in plasma-sprayed splats by electron-backscattered diffraction. / Shinoda, Kentaro; Demura, Masahiko; Murakami, Hideyuki; Kuroda, Seiji; Sampath, Sanjay.

In: Surface and Coatings Technology, Vol. 204, No. 21-22, 01.08.2010, p. 3614-3618.

Research output: Contribution to journalArticle

Shinoda, Kentaro ; Demura, Masahiko ; Murakami, Hideyuki ; Kuroda, Seiji ; Sampath, Sanjay. / Characterization of crystallographic texture in plasma-sprayed splats by electron-backscattered diffraction. In: Surface and Coatings Technology. 2010 ; Vol. 204, No. 21-22. pp. 3614-3618.
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