Characterization of high indium content metamorphic InGaAs/InAlAs modulation-doped heterostructures

Shin Ichiro Gozu, Tomohiro Kita, Yuuki Sato, Syoji Yamada, Masaaki Tomizawa

Research output: Contribution to journalConference article

18 Citations (Scopus)

Abstract

We have studied electronic and structural characterizations of high indium content metamorphic InGaAs/InAlAs modulation-doped heterostructures. An improved low-temperature electron mobility of μe = 5.45 × 105 cm2 V s in [1̄ 1 0] was confirmed for a directed Hall-bar sample when Si-doped InAlAs layer was slightly etched. In addition, in-plane mobility anisotropy of 40% between [1 1 0] and [1̄ 1 0] directions was confirmed. This anisotropy seems to be originated from the different undulation period between [1̄ 1 0] and [1 1 0] directions. We theoretically calculated electron mobility taking both alloy disorder scattering and background impurity scattering into account. It is found that the calculated and experimental values are in good agreement.

Original languageEnglish
Pages (from-to)155-160
Number of pages6
JournalJournal of Crystal Growth
Volume227-228
DOIs
Publication statusPublished - 2001 Jul 1
Externally publishedYes
Event11th International Conference on Molecular Beam Epitaxy - Bijing, China
Duration: 2000 Sep 112000 Sep 15

Fingerprint

Indium
Electron mobility
electron mobility
indium
Heterojunctions
Anisotropy
Modulation
Scattering
modulation
anisotropy
scattering
disorders
Impurities
impurities
electronics
Temperature
Direction compound

Keywords

  • A1. Low dimensional structures
  • A3. Molecular beam epitaxy
  • B1. Arsenates
  • B2. Semiconducting III-V materials
  • B3. High electron mobility transistors

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Characterization of high indium content metamorphic InGaAs/InAlAs modulation-doped heterostructures. / Gozu, Shin Ichiro; Kita, Tomohiro; Sato, Yuuki; Yamada, Syoji; Tomizawa, Masaaki.

In: Journal of Crystal Growth, Vol. 227-228, 01.07.2001, p. 155-160.

Research output: Contribution to journalConference article

Gozu, Shin Ichiro ; Kita, Tomohiro ; Sato, Yuuki ; Yamada, Syoji ; Tomizawa, Masaaki. / Characterization of high indium content metamorphic InGaAs/InAlAs modulation-doped heterostructures. In: Journal of Crystal Growth. 2001 ; Vol. 227-228. pp. 155-160.
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N2 - We have studied electronic and structural characterizations of high indium content metamorphic InGaAs/InAlAs modulation-doped heterostructures. An improved low-temperature electron mobility of μe = 5.45 × 105 cm2 V s in [1̄ 1 0] was confirmed for a directed Hall-bar sample when Si-doped InAlAs layer was slightly etched. In addition, in-plane mobility anisotropy of 40% between [1 1 0] and [1̄ 1 0] directions was confirmed. This anisotropy seems to be originated from the different undulation period between [1̄ 1 0] and [1 1 0] directions. We theoretically calculated electron mobility taking both alloy disorder scattering and background impurity scattering into account. It is found that the calculated and experimental values are in good agreement.

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