Characterization of refractive index changes of silica glass induced by ion microbeam

M. Hattori, Yoshimichi Ohki, M. Fujimaki, T. Souno, H. Nishikawa, E. Watanabe, M. Oikawa, T. Kamiya, K. Arakawa

    Research output: Contribution to journalArticle

    7 Citations (Scopus)

    Abstract

    Distributions of structural and refractive index changes of silica irradiated by H+ microbeam were studied by optical and atomic force microscopes (AFM). The AFM measurements on the microbeam irradiated area show the formation of a groove on the surface. In addition, a cross sectional observation on the surface parallel to the incident plane reveals surface deformation along the ion tracks, which is deepest at the projected range of ions. Taking into account the possible structural changes of silica induced by energy deposition calculated by TRIM, the measured topological changes at the front and side surfaces result from internal compaction of silica glass. Refractive index changes were estimated from the Lorentz-Lorenz relationship using the distribution of the internal compaction estimated by the AFM measurements.

    Original languageEnglish
    Pages (from-to)272-276
    Number of pages5
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume210
    DOIs
    Publication statusPublished - 2003 Sep

    Fingerprint

    microbeams
    silica glass
    Fused silica
    Refractive index
    Ions
    refractivity
    Microscopes
    microscopes
    Silicon Dioxide
    ions
    Compaction
    Silica
    silicon dioxide
    grooves
    energy

    Keywords

    • Atomic force microscope
    • Compaction
    • Ion microbeam
    • Refractive index change
    • Silica glass

    ASJC Scopus subject areas

    • Surfaces, Coatings and Films
    • Instrumentation
    • Surfaces and Interfaces

    Cite this

    Characterization of refractive index changes of silica glass induced by ion microbeam. / Hattori, M.; Ohki, Yoshimichi; Fujimaki, M.; Souno, T.; Nishikawa, H.; Watanabe, E.; Oikawa, M.; Kamiya, T.; Arakawa, K.

    In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 210, 09.2003, p. 272-276.

    Research output: Contribution to journalArticle

    Hattori, M. ; Ohki, Yoshimichi ; Fujimaki, M. ; Souno, T. ; Nishikawa, H. ; Watanabe, E. ; Oikawa, M. ; Kamiya, T. ; Arakawa, K. / Characterization of refractive index changes of silica glass induced by ion microbeam. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2003 ; Vol. 210. pp. 272-276.
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    AU - Ohki, Yoshimichi

    AU - Fujimaki, M.

    AU - Souno, T.

    AU - Nishikawa, H.

    AU - Watanabe, E.

    AU - Oikawa, M.

    AU - Kamiya, T.

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