Characterization of the local layer structure of a broad wall in a surface stabilized ferroelectric liquid crystal using synchrotron X-ray micro-diffraction

Atsuo Iida, Takashi Noma, Hirokatsu Miyata

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21 Citations (Scopus)

Abstract

The local layer structure of the broad wall of a zig-zag defect in a thin-surface stabilized ferroelectric liquid crystal cell was characterized using a synchrotron X-ray microbeam of less than 5 μm spatial resolution. By using a rocking curve measurement at the broad wall, multiple or broad peaks were observed between a pair of peaks due to a chevron structure. These new peaks are clear evidence of a modified pseudo-bookshelf structure at the wall. For 1.5 μm thick cells, a bookshelf layer is relatively flat, but is accompanied by small areas of inclined layer connecting the bookshelf and the chevron structures. For 10 μm thick cells, the pseudo-bookshelf structure bends or undulates both perpendicular and parallel to the rubbing direction. No appreciable change in the layer spacing was observed in the modified pseudo-bookshelf structure. The temperature dependence of the broad wall layer structure was also measured.

Original languageEnglish
Pages (from-to)160-167
Number of pages8
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume35
Issue number1 A
DOIs
Publication statusPublished - 1996 Jan
Externally publishedYes

Keywords

  • Broad wall
  • Ferroelectric liquid crystal
  • Layer structure
  • Liquid crystal
  • Surface stabilized ferroelectric liquid crystal
  • Synchrotron radiation
  • X-ray micro-diffraction
  • X-ray microbeam
  • Zig-zag defect

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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