Characterization of the local layer structure of a narrow wall in a surface stabilized ferroelectric liquid crystal using synchrotron X-ray micro-diffraction

Atsuo Iida, Takashi Noma, Hirokatsu Miyata

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Synchrotron X-ray microbeam small angle diffraction experiments were carried out for the characterization of the local layer structure of the narrow wall of a zig-zag defect in a surface stabilized ferroelectric liquid crystal cell. A series of the rocking curve (ω) and the azimuthal (χ) intensity distribution profiles were measured as a function of the vertical position across the narrow wall. The local layer was deflected at the wall in the χ direction. For the inclined narrow wall making an angle of a few degrees to 10° with respect to the rubbing direction, the deflected layer bent in both ω and χ directions. At the narrow wall running parallel to the rubbing direction, the layer bent only in the ω direction. The local layer structure was discussed in relation to the surface anchoring effect and a uniformly bent layer structure was proposed to explain experimental results.

Original languageEnglish
Pages (from-to)1345-1351
Number of pages7
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number3 A
DOIs
Publication statusPublished - 2001 Mar
Externally publishedYes

Keywords

  • Ferroelectric liquid crystal
  • Local layer structure
  • Narrow wall
  • Synchrotron X-rays
  • X-ray microbeam
  • Zigzag defect

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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