Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits

R. Goda; S. Amakawa; Kosuke Katayama; K. Takano; T. Yoshida; M. Fujishima

doi:10.1109/ICMTS.2015.7106098

Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits

R. Goda, S. Amakawa, Kosuke Katayama, K. Takano, T. Yoshida, M. Fujishima

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

8 Citations (Scopus)

Abstract

A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z₀ → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.

Original language	English
Title of host publication	ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	220-223
Number of pages	4
Volume	2015-May
ISBN (Electronic)	9781479983025
DOIs	https://doi.org/10.1109/ICMTS.2015.7106098
Publication status	Published - 2015 May 12
Externally published	Yes
Event	2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 - Tempe, United States Duration: 2015 Mar 23 → 2015 Mar 26

Other

Other	2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015
Country	United States
City	Tempe
Period	15/3/23 → 15/3/26

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ICMTS.2015.7106098

Fingerprint Dive into the research topics of 'Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits'. Together they form a unique fingerprint.

Cite this

Goda, R., Amakawa, S., Katayama, K., Takano, K., Yoshida, T., & Fujishima, M. (2015). Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. In ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures (Vol. 2015-May, pp. 220-223). [7106098] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS.2015.7106098

Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. / Goda, R.; Amakawa, S.; Katayama, Kosuke; Takano, K.; Yoshida, T.; Fujishima, M.

ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015. p. 220-223 7106098.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Goda, R, Amakawa, S, Katayama, K, Takano, K, Yoshida, T & Fujishima, M 2015, Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. in ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. vol. 2015-May, 7106098, Institute of Electrical and Electronics Engineers Inc., pp. 220-223, 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015, Tempe, United States, 15/3/23. https://doi.org/10.1109/ICMTS.2015.7106098

Goda R, Amakawa S, Katayama K, Takano K, Yoshida T, Fujishima M. Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. In ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May. Institute of Electrical and Electronics Engineers Inc. 2015. p. 220-223. 7106098 https://doi.org/10.1109/ICMTS.2015.7106098

Goda, R. ; Amakawa, S. ; Katayama, Kosuke ; Takano, K. ; Yoshida, T. ; Fujishima, M. / Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015. pp. 220-223

@inproceedings{6d2dfc40caf64617a08d61592a3cadb9,

title = "Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits",

abstract = "A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.",

author = "R. Goda and S. Amakawa and Kosuke Katayama and K. Takano and T. Yoshida and M. Fujishima",

year = "2015",

month = may,

day = "12",

doi = "10.1109/ICMTS.2015.7106098",

language = "English",

volume = "2015-May",

pages = "220--223",

booktitle = "ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 ; Conference date: 23-03-2015 Through 26-03-2015",

}

TY - GEN

T1 - Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits

AU - Goda, R.

AU - Amakawa, S.

AU - Katayama, Kosuke

AU - Takano, K.

AU - Yoshida, T.

AU - Fujishima, M.

PY - 2015/5/12

Y1 - 2015/5/12

N2 - A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.

AB - A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.

UR - http://www.scopus.com/inward/record.url?scp=84940783327&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84940783327&partnerID=8YFLogxK

U2 - 10.1109/ICMTS.2015.7106098

DO - 10.1109/ICMTS.2015.7106098

M3 - Conference contribution

AN - SCOPUS:84940783327

VL - 2015-May

SP - 220

EP - 223

BT - ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015

Y2 - 23 March 2015 through 26 March 2015

ER -