TY - GEN
T1 - Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits
AU - Goda, R.
AU - Amakawa, S.
AU - Katayama, K.
AU - Takano, K.
AU - Yoshida, T.
AU - Fujishima, M.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/12
Y1 - 2015/5/12
N2 - A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
AB - A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
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U2 - 10.1109/ICMTS.2015.7106098
DO - 10.1109/ICMTS.2015.7106098
M3 - Conference contribution
AN - SCOPUS:84940783327
T3 - IEEE International Conference on Microelectronic Test Structures
SP - 220
EP - 223
BT - ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015
Y2 - 23 March 2015 through 26 March 2015
ER -