Abstract
A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
| Original language | English |
|---|---|
| Title of host publication | ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 220-223 |
| Number of pages | 4 |
| Volume | 2015-May |
| ISBN (Electronic) | 9781479983025 |
| DOIs | |
| Publication status | Published - 2015 May 12 |
| Externally published | Yes |
| Event | 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 - Tempe, United States Duration: 2015 Mar 23 → 2015 Mar 26 |
Other
| Other | 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 |
|---|---|
| Country | United States |
| City | Tempe |
| Period | 15/3/23 → 15/3/26 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. / Goda, R.; Amakawa, S.; Katayama, Kosuke; Takano, K.; Yoshida, T.; Fujishima, M.
ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015. p. 220-223 7106098.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits
AU - Goda, R.
AU - Amakawa, S.
AU - Katayama, Kosuke
AU - Takano, K.
AU - Yoshida, T.
AU - Fujishima, M.
PY - 2015/5/12
Y1 - 2015/5/12
N2 - A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
AB - A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
UR - http://www.scopus.com/inward/record.url?scp=84940783327&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84940783327&partnerID=8YFLogxK
U2 - 10.1109/ICMTS.2015.7106098
DO - 10.1109/ICMTS.2015.7106098
M3 - Conference contribution
VL - 2015-May
SP - 220
EP - 223
BT - ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures
PB - Institute of Electrical and Electronics Engineers Inc.
ER -