Abstract
A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
Original language | English |
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Title of host publication | ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 220-223 |
Number of pages | 4 |
Volume | 2015-May |
ISBN (Electronic) | 9781479983025 |
DOIs | |
Publication status | Published - 2015 May 12 |
Externally published | Yes |
Event | 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 - Tempe, United States Duration: 2015 Mar 23 → 2015 Mar 26 |
Other
Other | 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 |
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Country | United States |
City | Tempe |
Period | 15/3/23 → 15/3/26 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering