Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits

R. Goda, S. Amakawa, Kosuke Katayama, K. Takano, T. Yoshida, M. Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.

Original languageEnglish
Title of host publicationICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages220-223
Number of pages4
Volume2015-May
ISBN (Electronic)9781479983025
DOIs
Publication statusPublished - 2015 May 12
Externally publishedYes
Event2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015 - Tempe, United States
Duration: 2015 Mar 232015 Mar 26

Other

Other2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015
CountryUnited States
CityTempe
Period15/3/2315/3/26

Fingerprint

Millimeter waves
Networks (circuits)
Electric lines
Scattering parameters

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Goda, R., Amakawa, S., Katayama, K., Takano, K., Yoshida, T., & Fujishima, M. (2015). Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. In ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures (Vol. 2015-May, pp. 220-223). [7106098] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS.2015.7106098

Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. / Goda, R.; Amakawa, S.; Katayama, Kosuke; Takano, K.; Yoshida, T.; Fujishima, M.

ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015. p. 220-223 7106098.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Goda, R, Amakawa, S, Katayama, K, Takano, K, Yoshida, T & Fujishima, M 2015, Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. in ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. vol. 2015-May, 7106098, Institute of Electrical and Electronics Engineers Inc., pp. 220-223, 2015 IEEE International Conference on Microelectronic Test Structures, ICMTS 2015, Tempe, United States, 15/3/23. https://doi.org/10.1109/ICMTS.2015.7106098
Goda R, Amakawa S, Katayama K, Takano K, Yoshida T, Fujishima M. Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. In ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May. Institute of Electrical and Electronics Engineers Inc. 2015. p. 220-223. 7106098 https://doi.org/10.1109/ICMTS.2015.7106098
Goda, R. ; Amakawa, S. ; Katayama, Kosuke ; Takano, K. ; Yoshida, T. ; Fujishima, M. / Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits. ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. Vol. 2015-May Institute of Electrical and Electronics Engineers Inc., 2015. pp. 220-223
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