Chemiluminescence due to oxidation of ethylene propylene diene copolymers

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Chemiluminescence analysis was applied to evaluate oxidation of ethylene propylene diene copolymers (EPDMs), and the results were analyzed through comparisons with those of low density polyethylene (LDPE) and cross-linked polyethylene (XLPE) with or without antioxidant. If LDPE or XLPE is being oxidized, CL appears abruptly in a frequency range from 300 to 850 nm after a certain incubation time. This incubation time corresponds to oxidation induction time (OIT). In contrast to LDPE or XLPE, when EPDM samples are heated in air, a strong CL intensity is observable from its initial stage, even if the amount of antioxidant in the sample is high enough. However, after the CL intensity decays once, it increases gradually to a certain peak and then it decays again. We can regard the time at which CL shows the peak as OIT, because it shows a positive correlation with the weight content of antioxidant in the sample. Furthermore, after the EPDM samples were aged in different conditions, namely by heat alone, by gamma-rays alone, and by simultaneously given heat and gamma-rays, the dependence of OIT on the aging period was examined for each condition. The resultant dependence of OIT was found to agree with the dependence observed by measuring the elongation-at-break and also with the one measured by differential scanning calorimetry.

Original languageEnglish
Title of host publication2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages425-428
Number of pages4
ISBN (Print)9781479975235
DOIs
Publication statusPublished - 2014 Dec 22
Event2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014 - Des Moines, United States
Duration: 2014 Oct 192014 Oct 22

Other

Other2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
CountryUnited States
CityDes Moines
Period14/10/1914/10/22

Fingerprint

Chemiluminescence
Propylene
Ethylene
Copolymers
Low density polyethylenes
Oxidation
Antioxidants
Gamma rays
Polyethylenes
Elongation
Differential scanning calorimetry
Aging of materials
Air

Keywords

  • antioxidant
  • Chemiluminescence
  • elongation-at-break
  • insulating material
  • oxidation induction time

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Ohki, Y., & Hirai, N. (2014). Chemiluminescence due to oxidation of ethylene propylene diene copolymers. In 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014 (pp. 425-428). [6995786] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP.2014.6995786

Chemiluminescence due to oxidation of ethylene propylene diene copolymers. / Ohki, Yoshimichi; Hirai, Naoshi.

2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 425-428 6995786.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ohki, Y & Hirai, N 2014, Chemiluminescence due to oxidation of ethylene propylene diene copolymers. in 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014., 6995786, Institute of Electrical and Electronics Engineers Inc., pp. 425-428, 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014, Des Moines, United States, 14/10/19. https://doi.org/10.1109/CEIDP.2014.6995786
Ohki Y, Hirai N. Chemiluminescence due to oxidation of ethylene propylene diene copolymers. In 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 425-428. 6995786 https://doi.org/10.1109/CEIDP.2014.6995786
Ohki, Yoshimichi ; Hirai, Naoshi. / Chemiluminescence due to oxidation of ethylene propylene diene copolymers. 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 425-428
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