Combining binary-SVM and pairwise label constraints for multi-label classification

Weifeng Gu, Benhui Chen, Takayuki Furuzuki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Multi-label classification is an extension of traditional classification problem in which each instance is associated with a set of labels. Recent research has shown that the ranking approach is an effective way to solve this problem. In the multi-labeled sets, classes are often related to each other. Some implicit constraint rules are existed among the labels. So we present a novel multi-label ranking algorithm inspired by the pairwise constraint rules mined from the training set to enhance the existing method. In this method, one-against-all decomposition technique is used firstly to divide a multi-label problem into binary class sub-problems. A rank list is generated by combining the probabilistic outputs of each binary Support Vector Machine (SVM) classifier. Label constraint rules are learned by minimizing the ranking loss. Experimental performance evaluation on well-known multi-label benchmark datasets show that our method improves the classification accuracy efficiently, compared with some existed methods.

Original languageEnglish
Title of host publicationConference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
Pages4176-4181
Number of pages6
DOIs
Publication statusPublished - 2010
Event2010 IEEE International Conference on Systems, Man and Cybernetics, SMC 2010 - Istanbul
Duration: 2010 Oct 102010 Oct 13

Other

Other2010 IEEE International Conference on Systems, Man and Cybernetics, SMC 2010
CityIstanbul
Period10/10/1010/10/13

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Keywords

  • Constraint rules
  • Multi-label classification
  • Support vector machine

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Human-Computer Interaction

Cite this

Gu, W., Chen, B., & Furuzuki, T. (2010). Combining binary-SVM and pairwise label constraints for multi-label classification. In Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics (pp. 4176-4181). [5642395] https://doi.org/10.1109/ICSMC.2010.5642395