Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement

Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (tn) and hole-trapping (log(t)) theories. A single shot of DC stress and recovery data is utilized to express duty cycle dependence of NBTI degradation and recovery. Parameter fitting is proceeded by considering that the amount of recovery cannot be larger than stress degradation. The proposed model successfully replicates stress and recovery with various duty cycles.

Original languageEnglish
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages305-309
Number of pages5
ISBN (Electronic)9781728124902
DOIs
Publication statusPublished - 2019 Jul
Externally publishedYes
Event25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
Duration: 2019 Jul 12019 Jul 3

Publication series

Name2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Country/TerritoryGreece
CityRhodes
Period19/7/119/7/3

Keywords

  • AC stress dependency
  • hole trapping
  • Negative bias temperature instability (NBTI)
  • reaction diffusion

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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