Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement

Takumi Hosaka; Shinichi Nishizawa; Ryo Kishida; Takashi Matsumoto; Kazutoshi Kobayashi

doi:10.1109/IOLTS.2019.8854421

Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement

Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (tⁿ) and hole-trapping (log(t)) theories. A single shot of DC stress and recovery data is utilized to express duty cycle dependence of NBTI degradation and recovery. Parameter fitting is proceeded by considering that the amount of recovery cannot be larger than stress degradation. The proposed model successfully replicates stress and recovery with various duty cycles.

Original language	English
Title of host publication	2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Editors	Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	305-309
Number of pages	5
ISBN (Electronic)	9781728124902
DOIs	https://doi.org/10.1109/IOLTS.2019.8854421
Publication status	Published - 2019 Jul
Externally published	Yes
Event	25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece Duration: 2019 Jul 1 → 2019 Jul 3

Publication series

Name	2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference	25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Country/Territory	Greece
City	Rhodes
Period	19/7/1 → 19/7/3

Keywords

AC stress dependency
hole trapping
Negative bias temperature instability (NBTI)
reaction diffusion

ASJC Scopus subject areas

Artificial Intelligence
Computer Networks and Communications
Hardware and Architecture
Safety, Risk, Reliability and Quality

Access to Document

10.1109/IOLTS.2019.8854421

Cite this

Hosaka, T., Nishizawa, S., Kishida, R., Matsumoto, T., & Kobayashi, K. (2019). Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. In D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 305-309). [8854421] (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854421

Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. / Hosaka, Takumi; Nishizawa, Shinichi; Kishida, Ryo et al.

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. ed. / Dimitris Gizopoulos; Dan Alexandrescu; Panagiota Papavramidou; Michail Maniatakos. Institute of Electrical and Electronics Engineers Inc., 2019. p. 305-309 8854421 (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hosaka, T, Nishizawa, S, Kishida, R, Matsumoto, T & Kobayashi, K 2019, Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. in D Gizopoulos, D Alexandrescu, P Papavramidou & M Maniatakos (eds), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019., 8854421, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Institute of Electrical and Electronics Engineers Inc., pp. 305-309, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, 19/7/1. https://doi.org/10.1109/IOLTS.2019.8854421

Hosaka T, Nishizawa S, Kishida R, Matsumoto T, Kobayashi K. Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. In Gizopoulos D, Alexandrescu D, Papavramidou P, Maniatakos M, editors, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 305-309. 8854421. (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). doi: 10.1109/IOLTS.2019.8854421

Hosaka, Takumi ; Nishizawa, Shinichi ; Kishida, Ryo et al. / Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. editor / Dimitris Gizopoulos ; Dan Alexandrescu ; Panagiota Papavramidou ; Michail Maniatakos. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 305-309 (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).

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abstract = "In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (tn) and hole-trapping (log(t)) theories. A single shot of DC stress and recovery data is utilized to express duty cycle dependence of NBTI degradation and recovery. Parameter fitting is proceeded by considering that the amount of recovery cannot be larger than stress degradation. The proposed model successfully replicates stress and recovery with various duty cycles.",

keywords = "AC stress dependency, hole trapping, Negative bias temperature instability (NBTI), reaction diffusion",

author = "Takumi Hosaka and Shinichi Nishizawa and Ryo Kishida and Takashi Matsumoto and Kazutoshi Kobayashi",

note = "Funding Information: This work has been partly supported by Renesas Electronics. This work is also partly supported by VLSI Design and Education Center (VDEC), the University of Tokyo in collaboration with Synopsys, Inc. Publisher Copyright: {\textcopyright} 2019 IEEE.; 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 ; Conference date: 01-07-2019 Through 03-07-2019",

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Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement

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