Abstract
Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.
Original language | English |
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Title of host publication | 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 91-93 |
Number of pages | 3 |
ISBN (Electronic) | 9781467377942 |
DOIs | |
Publication status | Published - 2016 Jan 8 |
Externally published | Yes |
Event | IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Sendai, Japan Duration: 2015 Aug 26 → 2015 Aug 28 |
Other
Other | IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 |
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Country | Japan |
City | Sendai |
Period | 15/8/26 → 15/8/28 |
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering