Abstract
Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.
| Original language | English |
|---|---|
| Title of host publication | 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 91-93 |
| Number of pages | 3 |
| ISBN (Electronic) | 9781467377942 |
| DOIs | |
| Publication status | Published - 2016 Jan 8 |
| Externally published | Yes |
| Event | IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Sendai, Japan Duration: 2015 Aug 26 → 2015 Aug 28 |
Other
| Other | IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 |
|---|---|
| Country | Japan |
| City | Sendai |
| Period | 15/8/26 → 15/8/28 |
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ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering
Cite this
Comparative analysis of on-chip transmission line de-embedding techniques. / Amakawa, S.; Katayama, Kosuke; Takano, K.; Yoshida, T.; Fujishima, M.
2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. p. 91-93 7377897.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Comparative analysis of on-chip transmission line de-embedding techniques
AU - Amakawa, S.
AU - Katayama, Kosuke
AU - Takano, K.
AU - Yoshida, T.
AU - Fujishima, M.
PY - 2016/1/8
Y1 - 2016/1/8
N2 - Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.
AB - Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.
UR - http://www.scopus.com/inward/record.url?scp=84963617420&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84963617420&partnerID=8YFLogxK
U2 - 10.1109/RFIT.2015.7377897
DO - 10.1109/RFIT.2015.7377897
M3 - Conference contribution
AN - SCOPUS:84963617420
SP - 91
EP - 93
BT - 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
ER -