Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation

Naoshi Hirai, Takayuki Yamada, Yoshimichi Ohki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

A new method called the broadband impedance spectroscopy (BIS), which is a kind of frequency domain reflectometry, is being developed as a reliable method for locating a degraded portion of a low voltage cable. The sensitivity of the BIS method is compared to that of the time domain reflectometry (TDR). In the first case, the sheath and insulation of a 50-m-long polyvinyl chloride insulated cable were partially peeled off. In the second case, cables insulated with silicone rubber, flame-retardant ethylene propylene rubber, or cross-linked polyethylene, each about 25 m long, were aged simultaneously by heat and γ-irradiation in air. In both two cases, a clear peak indicating the damaged or aged portion appears in the BIS measurement, while no such a peak appears in the TDR measurement. Therefore, the BIS method is much superior to the TDR method for locating a degraded portion in a cable.

Original languageEnglish
Title of host publicationProceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
Pages229-232
Number of pages4
DOIs
Publication statusPublished - 2012
Event2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012 - Bali
Duration: 2012 Sep 232012 Sep 27

Other

Other2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
CityBali
Period12/9/2312/9/27

Fingerprint

Cables
Spectroscopy
Degradation
Rubber
Flame retardants
Polyvinyl chlorides
Silicones
Propylene
Polyethylenes
Insulation
Ethylene
Irradiation
Electric potential
Air

Keywords

  • Broadband impedance spectroscopy
  • diagnosis
  • frequency domain reflectometry
  • insulation
  • nuclear power plant
  • time domain reflectometry

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality

Cite this

Hirai, N., Yamada, T., & Ohki, Y. (2012). Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation. In Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012 (pp. 229-232). [6416417] https://doi.org/10.1109/CMD.2012.6416417

Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation. / Hirai, Naoshi; Yamada, Takayuki; Ohki, Yoshimichi.

Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012. 2012. p. 229-232 6416417.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hirai, N, Yamada, T & Ohki, Y 2012, Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation. in Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012., 6416417, pp. 229-232, 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012, Bali, 12/9/23. https://doi.org/10.1109/CMD.2012.6416417
Hirai N, Yamada T, Ohki Y. Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation. In Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012. 2012. p. 229-232. 6416417 https://doi.org/10.1109/CMD.2012.6416417
Hirai, Naoshi ; Yamada, Takayuki ; Ohki, Yoshimichi. / Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation. Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012. 2012. pp. 229-232
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