Computing Crystal Size Distribution by Focused-Beam Reflectance Measurement when Aspect Ratio Varies

Joi Unno, Ryuta Umeda, Izumi Hirasawa

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Chord length distribution (CLD) can be determined by an in-line measuring system with focused-beam reflectance measurement, but it can differ from crystal size distribution (CSD). However, expected values of CLD can be calculated from CSD by statistical methods and vice versa. In this study, a correlation equation between crystal size and aspect ratio during cooling crystallization was obtained and a mapping matrix was calculated based on the correlation equation. Then, the suspension obtained in cooling crystallization was sampled and CSDs were measured by microscopy at the same time that CLDs were measured with FBRM. As a result of error evaluation, transformation of CLD into CSD reduced the errors between CLDs and CSDs except in the early stage of crystallization.

Original languageEnglish
JournalChemical Engineering and Technology
DOIs
Publication statusAccepted/In press - 2018 Jan 1

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Reflectometers
Aspect ratio
Crystallization
Crystals
Cooling
Suspensions
Statistical methods
Microscopic examination

Keywords

  • Chord length distribution
  • Crystal size distribution
  • Crystallization
  • Focused-beam reflectance measurement

ASJC Scopus subject areas

  • Chemistry(all)
  • Chemical Engineering(all)
  • Industrial and Manufacturing Engineering

Cite this

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title = "Computing Crystal Size Distribution by Focused-Beam Reflectance Measurement when Aspect Ratio Varies",
abstract = "Chord length distribution (CLD) can be determined by an in-line measuring system with focused-beam reflectance measurement, but it can differ from crystal size distribution (CSD). However, expected values of CLD can be calculated from CSD by statistical methods and vice versa. In this study, a correlation equation between crystal size and aspect ratio during cooling crystallization was obtained and a mapping matrix was calculated based on the correlation equation. Then, the suspension obtained in cooling crystallization was sampled and CSDs were measured by microscopy at the same time that CLDs were measured with FBRM. As a result of error evaluation, transformation of CLD into CSD reduced the errors between CLDs and CSDs except in the early stage of crystallization.",
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AU - Unno, Joi

AU - Umeda, Ryuta

AU - Hirasawa, Izumi

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N2 - Chord length distribution (CLD) can be determined by an in-line measuring system with focused-beam reflectance measurement, but it can differ from crystal size distribution (CSD). However, expected values of CLD can be calculated from CSD by statistical methods and vice versa. In this study, a correlation equation between crystal size and aspect ratio during cooling crystallization was obtained and a mapping matrix was calculated based on the correlation equation. Then, the suspension obtained in cooling crystallization was sampled and CSDs were measured by microscopy at the same time that CLDs were measured with FBRM. As a result of error evaluation, transformation of CLD into CSD reduced the errors between CLDs and CSDs except in the early stage of crystallization.

AB - Chord length distribution (CLD) can be determined by an in-line measuring system with focused-beam reflectance measurement, but it can differ from crystal size distribution (CSD). However, expected values of CLD can be calculated from CSD by statistical methods and vice versa. In this study, a correlation equation between crystal size and aspect ratio during cooling crystallization was obtained and a mapping matrix was calculated based on the correlation equation. Then, the suspension obtained in cooling crystallization was sampled and CSDs were measured by microscopy at the same time that CLDs were measured with FBRM. As a result of error evaluation, transformation of CLD into CSD reduced the errors between CLDs and CSDs except in the early stage of crystallization.

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