Contact probe card with large overdrive

Gunsei Kimoto, Takehiro Watanabe, Souta Matsusaka, Takaharu Kuroda, Mikiko Saito

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, we present a new contact probe card with an insulating resin film that can achieve large overdrive. The probe pins were manufactured using Be-Cu through etching and silkscreen polyimide printing. It was confirmed that the probes have a long life expectancy because they act within the thresholds of elastic deformation. The proposed assembly technology allows us to achieve highly accurate probe units with a narrow pitch and a probe thickness of only 28 μm.

Original languageEnglish
Title of host publicationStudent Posters (General) - 218th ECS Meeting
Pages57-67
Number of pages11
Edition21
DOIs
Publication statusPublished - 2011 Dec 1
EventGeneral Student Poster Session - 218th ECS Meeting - Las Vegas, NV, United States
Duration: 2010 Oct 102010 Oct 15

Publication series

NameECS Transactions
Number21
Volume33
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceGeneral Student Poster Session - 218th ECS Meeting
CountryUnited States
CityLas Vegas, NV
Period10/10/1010/10/15

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Kimoto, G., Watanabe, T., Matsusaka, S., Kuroda, T., & Saito, M. (2011). Contact probe card with large overdrive. In Student Posters (General) - 218th ECS Meeting (21 ed., pp. 57-67). (ECS Transactions; Vol. 33, No. 21). https://doi.org/10.1149/1.3557572