Contact resistance modulation in carbon nanotube devices investigated by four-probe experiments

Takayoshi Kanbara, Taishi Takenobu, Tetsuo Takahashi, Yoshihiro Iwasa, Kazuhito Tsukagoshi, Yoshinobu Aoyagi, Hiromichi Kataura

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

The contact resistance (Rcont) between nanotube and metal electrodes was directly measured in a four-terminal configuration of field-effect transistors for individual single-walled carbon nanotube (SWNT) bundles and a multiwalled carbon nanotube (MWNT). Both Rcont and the nanotube resistance (RNT) in a semiconducting SWNT device drastically changed with gate voltage, while Rcont, being more than one-order smaller than Rcont in metallic SWNTs and MWNTs, was almost constant against the gate voltage. Carriers introduced either by gate voltage or chemical doping induced a rapid decrease in Rcont compared with the resistance of semiconducting SWNTs.

Original languageEnglish
Article number053118
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume88
Issue number5
DOIs
Publication statusPublished - 2006
Externally publishedYes

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contact resistance
carbon nanotubes
modulation
probes
nanotubes
electric potential
bundles
field effect transistors
electrodes
configurations
metals

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Kanbara, T., Takenobu, T., Takahashi, T., Iwasa, Y., Tsukagoshi, K., Aoyagi, Y., & Kataura, H. (2006). Contact resistance modulation in carbon nanotube devices investigated by four-probe experiments. Applied Physics Letters, 88(5), 1-3. [053118]. https://doi.org/10.1063/1.2171481

Contact resistance modulation in carbon nanotube devices investigated by four-probe experiments. / Kanbara, Takayoshi; Takenobu, Taishi; Takahashi, Tetsuo; Iwasa, Yoshihiro; Tsukagoshi, Kazuhito; Aoyagi, Yoshinobu; Kataura, Hiromichi.

In: Applied Physics Letters, Vol. 88, No. 5, 053118, 2006, p. 1-3.

Research output: Contribution to journalArticle

Kanbara, T, Takenobu, T, Takahashi, T, Iwasa, Y, Tsukagoshi, K, Aoyagi, Y & Kataura, H 2006, 'Contact resistance modulation in carbon nanotube devices investigated by four-probe experiments', Applied Physics Letters, vol. 88, no. 5, 053118, pp. 1-3. https://doi.org/10.1063/1.2171481
Kanbara T, Takenobu T, Takahashi T, Iwasa Y, Tsukagoshi K, Aoyagi Y et al. Contact resistance modulation in carbon nanotube devices investigated by four-probe experiments. Applied Physics Letters. 2006;88(5):1-3. 053118. https://doi.org/10.1063/1.2171481
Kanbara, Takayoshi ; Takenobu, Taishi ; Takahashi, Tetsuo ; Iwasa, Yoshihiro ; Tsukagoshi, Kazuhito ; Aoyagi, Yoshinobu ; Kataura, Hiromichi. / Contact resistance modulation in carbon nanotube devices investigated by four-probe experiments. In: Applied Physics Letters. 2006 ; Vol. 88, No. 5. pp. 1-3.
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