Correlation between composition, microstructure, and ferroelectric properties of SrBi 2Ta 2O 9 thin films

Sachiko Ono, Akira Sakakibara, Tomonori Seki, Tetsuya Osaka, Ichiro Koiwa, Juro Mita, Toshiyuki Iwabuchi, Katsuhiko Asami

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

SrBi 2Ta 2O 9 thin films prepared by a solution-deposition process were formed at various annealing temperatures. P-E hysteresis loops of the fims exhibited well-defined shapes, and the leakage current decreased with increasing annealing temperature except for one annealed at 750°C. The considerable amount of metallic Bi on the film surface diffused from the inner part was evaluated by a quantitative x-ray photoelectron spectroscopic analysis. A discontinuity in morphology such as cavities detected by transmission electron microscopic observation at grain boundaries between large single-crystal grains and microcrystallite regions, which was pronounced in the film annealed at 750°C, is suggested as inducing an increase in leakage current by the condensation of metallic Bi at the cavities.

Original languageEnglish
JournalJournal of the Electrochemical Society
Volume144
Issue number7
Publication statusPublished - 1997 Jul

Fingerprint

Leakage currents
Ferroelectric materials
leakage
Annealing
Thin films
microstructure
Microstructure
cavities
annealing
Spectroscopic analysis
spectroscopic analysis
Hysteresis loops
thin films
Photoelectrons
Chemical analysis
Condensation
discontinuity
Grain boundaries
photoelectrons
grain boundaries

ASJC Scopus subject areas

  • Electrochemistry
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Correlation between composition, microstructure, and ferroelectric properties of SrBi 2Ta 2O 9 thin films. / Ono, Sachiko; Sakakibara, Akira; Seki, Tomonori; Osaka, Tetsuya; Koiwa, Ichiro; Mita, Juro; Iwabuchi, Toshiyuki; Asami, Katsuhiko.

In: Journal of the Electrochemical Society, Vol. 144, No. 7, 07.1997.

Research output: Contribution to journalArticle

Ono, S, Sakakibara, A, Seki, T, Osaka, T, Koiwa, I, Mita, J, Iwabuchi, T & Asami, K 1997, 'Correlation between composition, microstructure, and ferroelectric properties of SrBi 2Ta 2O 9 thin films', Journal of the Electrochemical Society, vol. 144, no. 7.
Ono, Sachiko ; Sakakibara, Akira ; Seki, Tomonori ; Osaka, Tetsuya ; Koiwa, Ichiro ; Mita, Juro ; Iwabuchi, Toshiyuki ; Asami, Katsuhiko. / Correlation between composition, microstructure, and ferroelectric properties of SrBi 2Ta 2O 9 thin films. In: Journal of the Electrochemical Society. 1997 ; Vol. 144, No. 7.
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AU - Koiwa, Ichiro

AU - Mita, Juro

AU - Iwabuchi, Toshiyuki

AU - Asami, Katsuhiko

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