Correlation between indenter modulus and elongation-at-break observed for four electrical insulating polymers

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The correlation between degradation-induced changes in two important indicators of mechanical properties, namely elongation at break (EAB) and indenter modulus (IM), is examined for flame-retardant ethylene propylene rubber (FR-EPR), silicone rubber (SiR), flame-retardant crosslinked polyethylene (FR-XLPE), and XLPE. The samples were degraded by heat or concurrently by heat and radiation. In the case that the polymers become hard after they were degraded, the two indicators show a good correlation. However, if they become brittle, their correlation is not good. Regarding this, their correlation is good in SiR, while it is not good in FR-XLPE and XLPE. In FR-EPR, the correlativity changes, depending on the aging condition and presumably its additives.

Original languageEnglish
Title of host publicationProceedings of 2017 International Symposium on Electrical Insulating Materials, ISEIM 2017
PublisherInstitute of Electrical Engineers of Japan
Pages753-756
Number of pages4
Volume2
ISBN (Electronic)9784886860996
DOIs
Publication statusPublished - 2017 Dec 4
Event2017 International Symposium on Electrical Insulating Materials, ISEIM 2017 - Toyohashi, Japan
Duration: 2017 Sep 112017 Sep 15

Other

Other2017 International Symposium on Electrical Insulating Materials, ISEIM 2017
CountryJapan
CityToyohashi
Period17/9/1117/9/15

Keywords

  • Brittleness
  • Degradation
  • Flameretardancy
  • Mechanical property
  • Surface hardness

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Hirai, N., & Ohki, Y. (2017). Correlation between indenter modulus and elongation-at-break observed for four electrical insulating polymers. In Proceedings of 2017 International Symposium on Electrical Insulating Materials, ISEIM 2017 (Vol. 2, pp. 753-756). Institute of Electrical Engineers of Japan. https://doi.org/10.23919/ISEIM.2017.8166598