Correlation between static random access memory power-up state and transistor variation

Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Hirofumi Shinohara, Masaharu Kobayashi, Toshiro Hiramoto

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The correlation between the static random access memory (SRAM) power-up state (i.e., state 0 or 1 immediately after the power supply is turned on) and cell transistor variation is systematically studied by circuit simulations and mismatch space partitioning. It is revealed that, while both the mismatches of pFETs (pull-up) and nFETs (pull-down and access) contribute, their relative importance changes depending on the voltage ramping speed. The static retention noise margin well correlates with the power-up state only if the ramping speed is sufficiently low. Otherwise, pull-up transistor mismatch dominates the power-up state determination owing to the interference of capacitive current and asymmetrical capacitive coupling of the storage nodes to the ground and power supply.

Original languageEnglish
Article number04CD03
JournalJapanese Journal of Applied Physics
Volume56
Issue number4
DOIs
Publication statusPublished - 2017 Apr 1

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random access memory
power supplies
Transistors
transistors
Data storage equipment
Circuit simulation
margins
interference
Electric potential
electric potential
cells
simulation

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Correlation between static random access memory power-up state and transistor variation. / Takeuchi, Kiyoshi; Mizutani, Tomoko; Saraya, Takuya; Shinohara, Hirofumi; Kobayashi, Masaharu; Hiramoto, Toshiro.

In: Japanese Journal of Applied Physics, Vol. 56, No. 4, 04CD03, 01.04.2017.

Research output: Contribution to journalArticle

Takeuchi, Kiyoshi ; Mizutani, Tomoko ; Saraya, Takuya ; Shinohara, Hirofumi ; Kobayashi, Masaharu ; Hiramoto, Toshiro. / Correlation between static random access memory power-up state and transistor variation. In: Japanese Journal of Applied Physics. 2017 ; Vol. 56, No. 4.
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