CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES.

Shin ichi Akanuma, Nobuo Kishimoto, Takatoshi Irie, Naoto Kobayashi, Masakatsu Sakisaka

Research output: Contribution to journalArticle

Abstract

An automated Bragg spectrometer in whcih an organic electron multiplier is employed as an X-ray detector has been designed, and the K// alpha diagram and satellite X-rays from silicon bombarded with hydrogen and helium ions at MeV energies have been analyzed. The procedures for deriving the ionization cross sections from the satellite intensities are described. The multiple KL**m ionization cross sections are compared with the theoretical binomial distribution, which is a statistical superposition of single ionizations.

Original languageEnglish
Pages (from-to)208-219
Number of pages12
JournalMemoirs of the Faculty of Engineering, Kyoto University
Volume41
Issue numberpt 3
Publication statusPublished - 1979 Jul
Externally publishedYes

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Alpha particles
Ionization
Protons
X rays
Silicon
Satellites
Electron multipliers
Helium
Spectrometers
Detectors
Hydrogen
Ions

ASJC Scopus subject areas

  • Engineering(all)

Cite this

CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES. / Akanuma, Shin ichi; Kishimoto, Nobuo; Irie, Takatoshi; Kobayashi, Naoto; Sakisaka, Masakatsu.

In: Memoirs of the Faculty of Engineering, Kyoto University, Vol. 41, No. pt 3, 07.1979, p. 208-219.

Research output: Contribution to journalArticle

Akanuma, Shin ichi ; Kishimoto, Nobuo ; Irie, Takatoshi ; Kobayashi, Naoto ; Sakisaka, Masakatsu. / CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES. In: Memoirs of the Faculty of Engineering, Kyoto University. 1979 ; Vol. 41, No. pt 3. pp. 208-219.
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