CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES.

Shin ichi Akanuma, Nobuo Kishimoto, Takatoshi Irie, Naoto Kobayashi, Masakatsu Sakisaka

Research output: Contribution to journalArticlepeer-review

Abstract

An automated Bragg spectrometer in whcih an organic electron multiplier is employed as an X-ray detector has been designed, and the K// alpha diagram and satellite X-rays from silicon bombarded with hydrogen and helium ions at MeV energies have been analyzed. The procedures for deriving the ionization cross sections from the satellite intensities are described. The multiple KL**m ionization cross sections are compared with the theoretical binomial distribution, which is a statistical superposition of single ionizations.

Original languageEnglish
Pages (from-to)208-219
Number of pages12
JournalMemoirs of the Faculty of Engineering, Kyoto University
Volume41
Issue numberpt 3
Publication statusPublished - 1979 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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